APPLICATION OF TI-W BARRIER METALLIZATION FOR INTEGRATED-CIRCUITS

被引:100
作者
GHATE, PB
BLAIR, JC
FULLER, CR
MCGUIRE, GE
机构
关键词
D O I
10.1016/0040-6090(78)90024-X
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:117 / 128
页数:12
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