ELECTRON HOLOGRAPHY IN THE STUDY OF THE ELECTROSTATIC FIELDS - THE CASE OF CHARGED MICROTIPS

被引：67

作者：

MATTEUCCI, G ^{[1
]}

MISSIROLI, GF ^{[1
]}

MUCCINI, M ^{[1
]}

POZZI, G ^{[1
]}

机构：

[1] UNIV LECCE,DIPARTIMENTO SCI MAT,I-73100 LECCE,ITALY

来源：

ULTRAMICROSCOPY | 1992年 / 45卷 / 01期

关键词：

D O I：

10.1016/0304-3991(92)90039-M

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The use of electron holography has been tested to map the electrostatic field around a charged microtip. Theoretical and experimental results show that whenever a modulated reference wave is used the equiphase lines observed in the final maps are not directly or simply related to the potential distribution. A set of double-exposure holograms has been used to circumvent the limited brightness and coherence of the field emission gun so as to obtain a larger useful field.

引用

页码：77 / 83

页数：7

共 14 条

[1] MAPPING OF MICROELECTROSTATIC FIELDS BY MEANS OF ELECTRON HOLOGRAPHY - THEORETICAL AND EXPERIMENTAL RESULTS [J].