DIELECTRIC-BREAKDOWN AND DEVICE EVALUATION OF FRITTED GLASS COMPOSITIONS

被引：7

作者：

FLOWERS, DL

机构：

来源：

关键词：

D O I：

10.1149/1.2127213

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

页码：2179 / 2183

页数：5

共 9 条

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[3]

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[4]

FLOWERS DL, 1978, EL SOC EXT ABSTR, P644

[5]

FLOWERS DL, 1979, EL SOC EXT ABSTR, P746

[6]

FRITZSCHE C, 1967, Z ANGEW PHYSIK, V24, P48

[7] MECHANISM OF SELF-HEALING ELECTRICAL BREAKDOWN IN MOS STRUCTURES [J].

KLEIN, N .

[8] MAXIMUM DIELECTRIC STRENGTH OF THIN SILICON OXIDE FILMS [J].

KLEIN, N ;

GAFNI, H .

SNOW, EH ;

DEAL, BE .