A COMPUTER MODELING STUDY OF HIGH-RESOLUTION ELECTRON-MICROSCOPE IMAGES OF AMORPHOUS-TO-CRYSTALLINE TRANSITION BOUNDARIES

被引：6

作者：

KRAKOW, W ^{[1
]}

机构：

[1] XEROX CORP,ROCHESTER,NY 14644

来源：

ULTRAMICROSCOPY | 1980年 / 5卷 / 02期

关键词：

D O I：

10.1016/0304-3991(80)90023-6

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：175 / 194

页数：20

共 24 条

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