HIGH-POWER HIGHLY-RELIABLE OPERATION OF 0.98-MU-M INGAAS-INGAP STRAIN-COMPENSATED SINGLE-QUANTUM-WELL LASERS WITH TENSILE-STRAINED INGAASP BARRIERS

被引:45
作者
SAGAWA, M [1 ]
TOYONAKA, T [1 ]
HIRAMOTO, K [1 ]
SHINODA, K [1 ]
UOMI, K [1 ]
机构
[1] HITACHI LTD,DIV FIBEROPT,KOKUBUNJI,TOKYO 185,JAPAN
关键词
D O I
10.1109/2944.401196
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We compared 0.98-mu m lasers with a strain-compensated active layer consisting of a compressive InGaAs well. and tensile-strained InGaAsP barriers with identical lasers that have a conventional active layer with GaAs barriers. It was shown that the lasers with InGaAsP barriers have better temperature characteristics due to the larger energy gap difference between a well and barriers. Because of the high characteristic temperature, 200-mW operation was obtained with the InGaAsP-barrier laser even at 90 degrees C without any significant deterioration. We also showed that the operation of the lasers with a strain-compensated active layer was highly reliable, The degradation rate of these lasers was four times smaller than that of the lasers with GaAs barriers due to the better crystal quality in their active layer. The estimated lifetime at 25 degrees C for the lasers with a strain-compensated active layer was more than 170000 hours.
引用
收藏
页码:189 / 195
页数:7
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