STRUCTURAL STUDIES OF THE CRYSTAL SOLUTION INTERFACE USING SYNCHROTRON RADIATION

A novel in-situ system for the investigation of the structural nature of the crystal/solution interface is presented. A combination of synchrotron radiation and high resolution X-ray diffraction enables the growth interface to be studied under a thick overlayer of saturated solution. Data on the growth and dissolution of the (100) crystal surface of ADP under 6 mm of thick saturated solution is presented which indicates the existence of an ordered layer at the crystal/solution interface. Kinetic studies reveal this interfacial layer to be highly labile. © 1990, Elsevier Science Publishers B.V.. All rights reserved.