MEASUREMENT OF SEMICONDUCTOR CARRIER CONCENTRATION PROFILES

被引：10

作者：

HUGHES, FD

WILSON, M

HEADON, RF

机构：

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1972年 / 5卷 / 03期

关键词：

D O I：

10.1088/0022-3735/5/3/017

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：241 / &

相关论文

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