DETERMINATION OF (N,K) FOR ABSORBING THIN-FILMS USING REFLECTANCE MEASUREMENTS

被引:18
作者
SIQUEIROS, JM [1 ]
REGALADO, LE [1 ]
MACHORRO, R [1 ]
机构
[1] UNIV SONORA, CTR INVEST FIS, HERMOSILLO, SONORA, MEXICO
来源
APPLIED OPTICS | 1988年 / 27卷 / 20期
关键词
D O I
10.1364/AO.27.004260
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:4260 / 4264
页数:5
相关论文
共 18 条
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