DETERMINATION OF (N,K) FOR ABSORBING THIN-FILMS USING REFLECTANCE MEASUREMENTS

被引：18

作者：

SIQUEIROS, JM ^{[1
]}

REGALADO, LE ^{[1
]}

MACHORRO, R ^{[1
]}

机构：

[1] UNIV SONORA, CTR INVEST FIS, HERMOSILLO, SONORA, MEXICO

来源：

APPLIED OPTICS | 1988年 / 27卷 / 20期

关键词：

D O I：

10.1364/AO.27.004260

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：4260 / 4264

页数：5

共 18 条

[1] Abeles F., 1963, PROGRESS OPTICS, V2, P249
[2] MULTIPLE DETERMINATION OF THE OPTICAL-CONSTANTS OF THIN-FILM COATING MATERIALS
ARNDT, DP
AZZAM, RMA
BENNETT, JM
BORGOGNO, JP
CARNIGLIA, CK
CASE, WE
DOBROWOLSKI, JA
GIBSON, UJ
HART, TT
HO, FC
HODGKIN, VA
KLAPP, WP
MACLEOD, HA
PELLETIER, E
PURVIS, MK
QUINN, DM
STROME, DH
SWENSON, R
TEMPLE, PA
THONN, TF
[J]. APPLIED OPTICS, 1984, 23 (20): : 3571 - 3596
[3] Azzam RMA, 1977, ELLIPSOMETRY POLARIZ
[4] COMPUTATIONAL METHOD FOR DETERMINING N AND K FOR THIN FILM FROM MEASURED REFLECTANCE TRANSMITTANCE AND FILM THICKNESS
BENNETT, JM
BOOTY, MJ
[J]. APPLIED OPTICS, 1966, 5 (01): : 41 - &
[5] AUTOMATIC-DETERMINATION OF THE OPTICAL-CONSTANTS OF INHOMOGENEOUS THIN-FILMS
BORGOGNO, JP
LAZARIDES, B
PELLETIER, E
[J]. APPLIED OPTICS, 1982, 21 (22): : 4020 - 4029
[6] ALGEBRAIC-METHOD FOR EXTRACTING THIN-FILM OPTICAL-PARAMETERS FROM SPECTROPHOTOMETER MEASUREMENTS
CASE, WE
[J]. APPLIED OPTICS, 1983, 22 (12): : 1832 - 1836
[7] DETERMINATION OF OPTICAL-CONSTANTS OF THIN-FILM COATING MATERIALS BASED ON INVERSE SYNTHESIS
DOBROWOLSKI, JA
HO, FC
WALDORF, A
[J]. APPLIED OPTICS, 1983, 22 (20): : 3191 - 3200
[8] THIN-FILM COATINGS - ALGORITHMS FOR THE DETERMINATION OF REFLECTANCE AND TRANSMITTANCE, AND THEIR DERIVATIVES
DUPOISOT, H
MORIZET, J
[J]. APPLIED OPTICS, 1979, 18 (15) : 2701 - 2704
[9] ON THE DETERMINATION OF THE OPTICAL-CONSTANTS N(LAMBDA) AND ALPHA(LAMBDA) OF THIN SUPPORTED FILMS
ELIZALDE, E
RUEDA, F
[J]. THIN SOLID FILMS, 1984, 122 (01) : 45 - 57
[10] HEAVENS OS, 1964, PHYS THIN FILMS, V2, P193

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