ANALYSIS OF RECOMBINATION ACTIVITY OF NISI2 PLATELETS IN SI

被引:16
作者
KITTLER, M
SEIFERT, W
机构
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1995年 / 150卷 / 01期
关键词
D O I
10.1002/pssa.2211500140
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
An analysis of EBIC contrast measurements at individual NiSi2 particles in n-type silicon is presented. From the dependence of contrast on temperature and beam current, it is concluded that potential barriers control the recombination activity of the particles. Data deduced from the experiment are compared to the behaviour expected from theory.
引用
收藏
页码:463 / 470
页数:8
相关论文
共 11 条
[1]   THE SPACE-CHARGE REGION AROUND A METALLIC PLATELET IN A SEMICONDUCTOR [J].
DONOLATO, C .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1993, 8 (01) :45-49
[2]   A THEORETICAL-STUDY OF THE CHARGE COLLECTION CONTRAST OF LOCALIZED SEMICONDUCTOR DEFECTS WITH ARBITRARY RECOMBINATION ACTIVITY [J].
DONOLATO, C .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1992, 7 (01) :37-43
[3]   THE MAXIMUM CHARGE-COLLECTION CONTRAST OF A SPHERICAL DEFECT OR A SURFACE-PARALLEL DISLOCATION [J].
DONOLATO, C .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1993, 135 (01) :K13-K15
[4]  
FARVACQUE JL, IN PRESS
[5]  
HEYDENREICH J, 1981, SCANNING ELECTRON MI, V1, P351
[6]   RECOMBINATION PROPERTIES OF STRUCTURALLY WELL DEFINED NISI2 PRECIPITATES IN SILICON [J].
KITTLER, M ;
LARZ, J ;
SEIFERT, W ;
SEIBT, M ;
SCHROTER, W .
APPLIED PHYSICS LETTERS, 1991, 58 (09) :911-913
[7]   PRECIPITATION BEHAVIOR OF NICKEL IN SILICON [J].
SEIBT, M ;
SCHROTER, W .
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1989, 59 (02) :337-352
[8]  
SEIFERT W, 1993, I PHYS C SER, V134, P751
[9]  
SZE SM, 1981, PHYSICS SEMICONDUCTO
[10]   BARRIER INHOMOGENEITIES AT SCHOTTKY CONTACTS [J].
WERNER, JH ;
GUTTLER, HH .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (03) :1522-1533