2-COLOR LIGHT-EMITTING-DIODE SOURCE FOR HIGH-PRECISION PHASE-SHIFTING INTERFEROMETRY

被引:6
作者
DECK, L
DEMAREST, F
机构
[1] Zygo Corporation, Middlefield, CT, 06455-0448, Laurel Brook Road
关键词
D O I
10.1364/OL.18.001899
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We describe a two-color light-emitting-diode source that provides intense, uniform, and highly stable illumination with a wavelength precision sufficient for multiwavelength phase-shifting interferometry applications. The source has feedback-stabilized intensity and junction temperature sensing for wavelength compensation. It has a theoretical mean time between failure of more than 30,000 h, and the two colors provide a step measurement capability of greater than 2.5 mum. Measurements made with this source in an interferometric microscope show subangstrom repeatability.
引用
收藏
页码:1899 / 1901
页数:3
相关论文
共 9 条
[1]  
BIEGEN JF, 1988, SURF TOPOGRAPHY, V1, P469
[2]   EFFECT OF INTENSITY ERROR CORRELATION ON THE COMPUTED PHASE OF PHASE-SHIFTING INTERFEROMETRY [J].
BROPHY, CP .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1990, 7 (04) :537-541
[3]   2-WAVELENGTH PHASE-SHIFTING INTERFEROMETRY [J].
CHENG, YY ;
WYANT, JC .
APPLIED OPTICS, 1984, 23 (24) :4539-4543
[4]   STEP HEIGHT MEASUREMENT USING 2-WAVELENGTH PHASE-SHIFTING INTERFEROMETRY [J].
CREATH, K .
APPLIED OPTICS, 1987, 26 (14) :2810-2816
[5]   SYNTHETIC WAVELENGTH STABILIZATION FOR 2-COLOR LASER-DIODE INTERFEROMETRY [J].
DEGROOT, P ;
KISHNER, S .
APPLIED OPTICS, 1991, 30 (28) :4026-4033
[6]  
FUJIHARA T, 1989, Patent No. 4852985
[7]  
NUSSMEIER TA, 1982, Patent No. 4355899
[8]   LINEAR-APPROXIMATION FOR MEASUREMENT ERRORS IN PHASE-SHIFTING INTERFEROMETRY [J].
VANWINGERDEN, J ;
FRANKENA, HJ ;
SMORENBURG, C .
APPLIED OPTICS, 1991, 30 (19) :2718-2729
[9]   DEVELOPMENT OF A 3-DIMENSIONAL NONCONTACT DIGITAL OPTICAL PROFILER [J].
WYANT, JC ;
KOLIOPOULOS, CL ;
BHUSHAN, B ;
BASILA, D .
JOURNAL OF TRIBOLOGY-TRANSACTIONS OF THE ASME, 1986, 108 (01) :1-8