ANALYSIS OF THIN-FILMS AND INTERFACES

被引：4

作者：

POATE, JM ^{[1
]}

TU, KN ^{[1
]}

机构：

[1] IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA

来源：

PHYSICS TODAY | 1980年 / 33卷 / 05期

关键词：

D O I：

10.1063/1.2914078

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：34 / 38

页数：5

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