LOW-TEMPERATURE FORCE MICROSCOPE WITH ALL-FIBER INTERFEROMETER

被引:52
作者
ALBRECHT, TR [1 ]
GRUTTER, P [1 ]
RUGAR, D [1 ]
SMITH, DPE [1 ]
机构
[1] IBM CORP,DIV RES,PHYS GRP MUNCHEN,W-8000 MUNICH 40,GERMANY
关键词
D O I
10.1016/0304-3991(92)90498-9
中图分类号
TH742 [显微镜];
学科分类号
摘要
A low-temperature force microscope has been demonstrated which is suitable for both repulsive and attractive mode (including magnetic) imaging. This instrument uses microfabricated cantilevers and an all-fiber interferometer for remote sensing of cantilever deflection. The all-fiber interferometer is ideal for remote sensing, since the only connection between the microscope and the outside environment is a single optical fiber. This allows all electronic components to operate at room temperature far from the mechanical portion of the microscope. The microscope mechanics are enclosed in a cylindrical vacuum chamber which is inserted into a helium storage Dewar for refrigeration. The sample holder is fitted with either a superconducting magnet capable of 200 Oe or a permanent magnet for higher fields. The instrument has been used successfully for topographic imaging and magnetic force gradient imaging at 5 and 300 K. An appendix to this paper gives practical information for constructing the all-fiber interferometer.
引用
收藏
页码:1638 / 1646
页数:9
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