FORCE MICROSCOPE USING A FIBER-OPTIC DISPLACEMENT SENSOR

被引：228

作者：

RUGAR, D

MAMIN, HJ

ERLANDSSON, R

STERN, JE

TERRIS, BD

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1988年 / 59卷 / 11期

关键词：

D O I：

10.1063/1.1139958

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：2337 / 2340

页数：4

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[1] ATOMIC RESOLUTION IMAGING OF A NONCONDUCTOR BY ATOMIC FORCE MICROSCOPY
ALBRECHT, TR
QUATE, CF
[J]. JOURNAL OF APPLIED PHYSICS, 1987, 62 (07) : 2599 - 2602
[2] AMER NM, 1988, B AM PHYS SOC, V33, P319
[3] ATOMIC FORCE MICROSCOPE
BINNIG, G
QUATE, CF
GERBER, C
[J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933
[4] ATOMIC RESOLUTION WITH ATOMIC FORCE MICROSCOPE
BINNIG, G
GERBER, C
STOLL, E
ALBRECHT, TR
QUATE, CF
[J]. EUROPHYSICS LETTERS, 1987, 3 (12): : 1281 - 1286
[5] FIBER-OPTIC INTERFEROMETER FOR REMOTE SUBANGSTROM VIBRATION MEASUREMENT
DRAKE, AD
LEINER, DC
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1984, 55 (02) : 162 - 165
[6] ATOMIC FORCE MICROSCOPY USING OPTICAL INTERFEROMETRY
ERLANDSSON, R
MCCLELLAND, GM
MATE, CM
CHIANG, S
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02): : 266 - 270
[7] SINGLE-MODE FIBER FRACTIONAL WAVE DEVICES AND POLARIZATION CONTROLLERS
LEFEVRE, HC
[J]. ELECTRONICS LETTERS, 1980, 16 (20) : 778 - 780
[8] MAMIN HJ, UNPUB
[9] ATOMIC FORCE MICROSCOPY OF LIQUID-COVERED SURFACES - ATOMIC RESOLUTION IMAGES
MARTI, O
DRAKE, B
HANSMA, PK
[J]. APPLIED PHYSICS LETTERS, 1987, 51 (07) : 484 - 486
[10] HIGH-RESOLUTION MAGNETIC IMAGING OF DOMAINS IN TBFE BY FORCE MICROSCOPY
MARTIN, Y
RUGAR, D
WICKRAMASINGHE, HK
[J]. APPLIED PHYSICS LETTERS, 1988, 52 (03) : 244 - 246