INFRARED CONTRAST OF INCLUSIONS IN CDTE

被引：33

作者：

BRION, HG

MEWES, C

HAHN, I

SCHAUFELE, U

机构：

[1] Kristall-Labor, Institut für Metallphysik, Universität Göttingen, D-37073 Göttingen

来源：

JOURNAL OF CRYSTAL GROWTH | 1993年 / 134卷 / 3-4期

关键词：

D O I：

10.1016/0022-0248(93)90137-L

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

CdTe crystals have been grown by the Bridgman method with excess Cd and Te. Transmission infrared (IR) microscopy revealed inclusions in the monocrystalline CdTe matrix. Energy dispersive X-ray (EDX) analysis has been performed to determine their composition. Cd inclusions show a very specific contrast in the IR microscope. This contrast is discussed in terms of dislocations due to stress relief on account of a volume misfit between a Cd inclusion and the CdTe matrix.

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页码：281 / 286

页数：6

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