THE DIRECT MEASUREMENT OF DOSE ENHANCEMENT IN GAMMA-TEST FACILITIES

被引:6
作者
BURKE, EA [1 ]
LOWE, LF [1 ]
SNOWDEN, DP [1 ]
CAPPELLI, JR [1 ]
MITTLEMAN, S [1 ]
机构
[1] USAF,ROME AIR DEV CTR,BEDFORD,MA 01731
关键词
D O I
10.1109/23.45383
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1890 / 1895
页数:6
相关论文
共 18 条
[11]  
GARTH JC, 1983, IEEE T NUCL SCI, V33, P1266
[12]   DOSE ENHANCEMENT EFFECTS IN MOSFET ICS EXPOSED IN TYPICAL CO-60 FACILITIES [J].
KELLY, JG ;
LUERA, TF ;
POSEY, LD ;
VEHAR, DW ;
BROWN, DB ;
DOZIER, CM .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1983, 30 (06) :4388-4393
[13]  
KERRIS KG, 1985, IEEE T NUCL SCI, V32, P4356
[14]  
LOWE LF, 1982, IEEE T NUCL SCI, V30, P1992
[15]   DOSIMETRY AND TOTAL DOSE RADIATION TESTING OF GAAS DEVICES [J].
MEULENBERG, A ;
DOZIER, CM ;
ANDERSON, WT ;
MITTLEMAN, SD ;
ZUGICH, MH ;
CAEFER, CE .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1987, 34 (06) :1745-1750
[16]  
WALL JA, 1971, IEEE T NUCL SCI, V17, P305
[17]   COMPARISON OF ONETRAN CALCULATIONS WITH CO-60 DOSE PROFILE DATA TO DETERMINE THE PHOTON SPECTRUM [J].
WOOLF, S ;
GARTH, JC .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1986, 33 (06) :1252-1257
[18]  
WOOLF S, 1983, IEEE T NUCL SCI, V31, P1089