MONTE-CARLO CALCULATIONS OF STRUCTURE-INDUCED ELECTROMIGRATION FAILURE

被引：34

作者：

SCHOEN, JM ^{[1
]}

机构：

[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974

来源：

关键词：

D O I：

10.1063/1.327352

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：513 / 521

页数：9

共 11 条

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ATTARDO, MJ ;

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RUTLEDGE, R ;

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[4]

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[5]

FELTHAM P, 1957, ACTA METALL, V5

[6]

KING JR, 1971, PROBABILITY CHARTS D, pCH23

[7]

LI JCM, 1961, J APPL PHYS, V32, P3

[8]

Mann N. R., 1974, METHODS STAT ANAL RE, P102

[9]

SCOGGAN GA, 1975 P REL PHYS S, P151

TURNBULL, D ;

HOFFMAN, RE .

ACTA METALLURGICA, 1954, 2 (03) :419-426