MEASUREMENT OF MOBILITY PROFILES IN GAAS AT ROOM-TEMPERATURE BY CORBINO EFFECT

被引：7

作者：

POTH, H

机构：

来源：

SOLID-STATE ELECTRONICS | 1978年 / 21卷 / 06期

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D O I：

10.1016/0038-1101(78)90303-9

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

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页码：801 / 805

页数：5

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