FIELD-EFFECT MEASUREMENT ON THE FILM-SUBSTRATE AND FILM-VACUUM INTERFACES OF A-SI-H

被引：15

作者：

GUHA, S

NARASIMHAN, KL

NAVKHANDEWALA, RV

PIETRUSZKO, SM

机构：

来源：

APPLIED PHYSICS LETTERS | 1980年 / 37卷 / 06期

关键词：

D O I：

10.1063/1.91788

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

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页码：572 / 573

页数：2

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