SOME FUNDAMENTAL MEASUREMENTS OF THE ATMOSPHERIC-PRESSURE, MICROWAVE-INDUCED DISCHARGE

被引：29

作者：

GOODE, SR

OTTO, DC

机构：

来源：

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 1980年 / 35卷 / 09期

关键词：

D O I：

10.1016/0584-8547(80)80032-2

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

收藏

页码：569 / 579

页数：11

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[3] EVALUATION OF A MICROWAVE-INDUCED PLASMA IN HELIUM AT ATMOSPHERIC-PRESSURE AS AN ELEMENT-SELECTIVE DETECTOR FOR GAS-CHROMATOGRAPHY
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[6] ELECTRON TEMPERATURES AND ELECTRON CONCENTRATIONS AT LOW-PRESSURE IN MICROWAVE INDUCED PLASMAS
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[7] EXCITATION CONDITIONS IN A MIXED-GAS LOW-PRESSURE MICROWAVE INDUCED PLASMA
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[J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1976, 31 (10-1) : 537 - 545
[8] OPTIMIZATION OF THERMOSTATED ELECTRODELESS DISCHARGE LAMPS FOR ANALYTICAL ATOMIC SPECTROMETRY
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[J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1973, B 28 (08) : 263 - 288
[9] FUNDAMENTAL PROPERTIES CHARACTERIZING LOW-PRESSURE MICROWAVE-INDUCED PLASMAS AS EXCITATION SOURCES FOR SPECTROANALYTICAL CHEMISTRY
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[J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1973, B 28 (03) : 85 - 104
[10] SIMPLIFIED METHOD FOR SEALING TUNGSTEN ELECTRODES INTO QUARTZ
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