OPTICAL CHARACTERIZATION OF LOW-INDEX TRANSPARENT THIN-FILMS ON TRANSPARENT SUBSTRATES BY SPECTROSCOPIC ELLIPSOMETRY

[1] OPTICAL-PROPERTIES OF VERY THIN-FILMS [J]. THIN SOLID FILMS, 1976, 34 (02) : 291 - 302

[2] Aspnes D. E., 1983, Journal de Physique Colloque, V44, P3, DOI 10.1051/jphyscol:19831001

[3] ASPNES DE, 1976, OPTICAL PROPERTIES S, P186

[4] AZZAM RMA, 1977, ELLIPSOMETRY POLARIZ, P274

[5] PARAMETER CORRELATION AND PRECISION IN MULTIPLE-ANGLE ELLIPSOMETRY [J]. APPLIED OPTICS, 1981, 20 (17): : 3020 - 3026

[6] CHOICE OF CRITERIA FOR ELLIPSOMETRIC DETERMINATIONS ON THIN-FILMS [J]. THIN SOLID FILMS, 1972, 13 (02) : 341 - 350

[7] Chandler-Horowitz D., 1983, Journal de Physique Colloque, V44, P23

[8] PRINCIPAL ANGLE SPECTROSCOPIC ELLIPSOMETRY UTILIZING A ROTATING ANALYZER [J]. APPLIED OPTICS, 1982, 21 (16): : 2972 - 2977

[9] ELLIPSOMETRIC DATA-PROCESSING - AN EFFICIENT METHOD AND AN ANALYSIS OF THE RELATIVE ERRORS [J]. APPLIED OPTICS, 1985, 24 (20): : 3368 - 3373

[10] CHOPRA KL, 1969, THIN FILM PHENOMENA, P722

[1] OPTICAL-PROPERTIES OF VERY THIN-FILMS [J]. THIN SOLID FILMS, 1976, 34 (02) : 291 - 302

[2] Aspnes D. E., 1983, Journal de Physique Colloque, V44, P3, DOI 10.1051/jphyscol:19831001

[3] ASPNES DE, 1976, OPTICAL PROPERTIES S, P186

[4] AZZAM RMA, 1977, ELLIPSOMETRY POLARIZ, P274

[5] PARAMETER CORRELATION AND PRECISION IN MULTIPLE-ANGLE ELLIPSOMETRY [J]. APPLIED OPTICS, 1981, 20 (17): : 3020 - 3026

[6] CHOICE OF CRITERIA FOR ELLIPSOMETRIC DETERMINATIONS ON THIN-FILMS [J]. THIN SOLID FILMS, 1972, 13 (02) : 341 - 350

[7] Chandler-Horowitz D., 1983, Journal de Physique Colloque, V44, P23

[8] PRINCIPAL ANGLE SPECTROSCOPIC ELLIPSOMETRY UTILIZING A ROTATING ANALYZER [J]. APPLIED OPTICS, 1982, 21 (16): : 2972 - 2977

[9] ELLIPSOMETRIC DATA-PROCESSING - AN EFFICIENT METHOD AND AN ANALYSIS OF THE RELATIVE ERRORS [J]. APPLIED OPTICS, 1985, 24 (20): : 3368 - 3373

[10] CHOPRA KL, 1969, THIN FILM PHENOMENA, P722