MONOCLINIC DEFORMATION AND TILTING OF EPITAXIAL CDTE-FILMS ON GAAS AT 25-400-DEGREES-C

被引:5
作者
BICKMANN, K [1 ]
HAUCK, J [1 ]
MOCK, P [1 ]
BERGER, H [1 ]
机构
[1] HUMBOLDT UNIV BERLIN, INST KRISTALLOG & MAT FORSCH, O-1040 BERLIN, GERMANY
关键词
D O I
10.1016/0022-0248(93)90405-L
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Monocrystalline CdTe films of (111BAR) orientation were deposited on GaAs (001) with a vicinal angle of approximately 2-degrees. The orientation and monoclinic distortion of the films vary at 25-400-degrees-C because of the large differences in lattice constants and thermal expansion coefficients. X-ray diffraction measurements by the Bond method show a monoclinic distortion and a tilting with respect to the substrate by 1.33-degrees-1.44-degrees.
引用
收藏
页码:133 / 137
页数:5
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