MEASUREMENT OF INTERFACE STATE CHARGE IN MOS SYSTEM

被引：11

作者：

KOOMEN, J

机构：

来源：

SOLID-STATE ELECTRONICS | 1971年 / 14卷 / 07期

关键词：

D O I：

10.1016/0038-1101(71)90133-X

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：571 / +

页数：1

共 18 条

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