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INTERACTION OF O-2,CO,H2O,H-2 AND N-2 WITH THIN CHROMIUM FILMS STUDIED BY INTERNAL-STRESS MEASUREMENTS
被引:20
作者
:
MARTINZ, HP
论文数:
0
引用数:
0
h-index:
0
MARTINZ, HP
ABERMANN, R
论文数:
0
引用数:
0
h-index:
0
ABERMANN, R
机构
:
来源
:
THIN SOLID FILMS
|
1982年
/ 89卷
/ 02期
关键词
:
D O I
:
10.1016/0040-6090(82)90440-0
中图分类号
:
T [工业技术];
学科分类号
:
08 ;
摘要
:
引用
收藏
页码:133 / 138
页数:6
相关论文
共 12 条
[1]
THERMAL EFFECTS DURING THE DEPOSITION OF THIN SILVER, GOLD AND COPPER-FILMS AND THEIR INFLUENCE ON INTERNAL-STRESS MEASUREMENTS
ABERMANN, R
论文数:
0
引用数:
0
h-index:
0
ABERMANN, R
MARTINZ, HP
论文数:
0
引用数:
0
h-index:
0
MARTINZ, HP
KRAMER, R
论文数:
0
引用数:
0
h-index:
0
KRAMER, R
[J].
THIN SOLID FILMS,
1980,
70
(01)
: 127
-
137
[2]
INSITU DETERMINATION OF THE STRUCTURE OF THIN METAL-FILMS BY INTERNAL-STRESS MEASUREMENTS - STRUCTURE DEPENDENCE OF SILVER AND COPPER-FILMS ON OXYGEN-PRESSURE DURING DEPOSITION
ABERMANN, R
论文数:
0
引用数:
0
h-index:
0
ABERMANN, R
KOCH, R
论文数:
0
引用数:
0
h-index:
0
KOCH, R
[J].
THIN SOLID FILMS,
1980,
66
(02)
: 217
-
232
[3]
STRUCTURE AND INTERNAL-STRESS IN ULTRATHIN SILVER FILMS DEPOSITED ON MGF2 AND SIO SUBSTRATES
ABERMANN, R
论文数:
0
引用数:
0
h-index:
0
ABERMANN, R
KRAMER, R
论文数:
0
引用数:
0
h-index:
0
KRAMER, R
MASER, J
论文数:
0
引用数:
0
h-index:
0
MASER, J
[J].
THIN SOLID FILMS,
1978,
52
(02)
: 215
-
229
[4]
ELECTRON-MICROSCOPE STRUCTURE AND INTERNAL-STRESS IN THIN SILVER AND GOLD-FILMS DEPOSITED ONTO MGF2 AND SIO SUBSTRATES
ABERMANN, R
论文数:
0
引用数:
0
h-index:
0
机构:
Institut für Physikalische Chemie der Universität Innsbruck, A-6020 Innsbruck
ABERMANN, R
KOCH, R
论文数:
0
引用数:
0
h-index:
0
机构:
Institut für Physikalische Chemie der Universität Innsbruck, A-6020 Innsbruck
KOCH, R
KRAMER, R
论文数:
0
引用数:
0
h-index:
0
机构:
Institut für Physikalische Chemie der Universität Innsbruck, A-6020 Innsbruck
KRAMER, R
[J].
THIN SOLID FILMS,
1979,
58
(02)
: 365
-
370
[5]
X-RAY PHOTOELECTRON STUDIES OF REACTION OF CLEAN METALS (MG, AL,CR,MN) WITH OXYGEN AND WATER-VAPOR
FUGGLE, JC
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV STRATHCLYDE,MET DEPT,GLASGOW G1 1XL,SCOTLAND
FUGGLE, JC
WATSON, LM
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV STRATHCLYDE,MET DEPT,GLASGOW G1 1XL,SCOTLAND
WATSON, LM
FABIAN, DJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV STRATHCLYDE,MET DEPT,GLASGOW G1 1XL,SCOTLAND
FABIAN, DJ
AFFROSSMAN, S
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV STRATHCLYDE,MET DEPT,GLASGOW G1 1XL,SCOTLAND
AFFROSSMAN, S
[J].
SURFACE SCIENCE,
1975,
49
(01)
: 61
-
76
[6]
PHOTOEMISSION STUDY OF CHROMIUM(111) SURFACE INTERACTING WITH OXYGEN
GEWINNER, G
论文数:
0
引用数:
0
h-index:
0
GEWINNER, G
PERUCHETTI, JC
论文数:
0
引用数:
0
h-index:
0
PERUCHETTI, JC
JAEGLE, A
论文数:
0
引用数:
0
h-index:
0
JAEGLE, A
KALT, A
论文数:
0
引用数:
0
h-index:
0
KALT, A
[J].
SURFACE SCIENCE,
1978,
78
(02)
: 439
-
458
[7]
STRUCTURAL AND ELECTRICAL PROPERTIES OF CHROMIUM AND NICKEL FILMS EVAPORATED IN PRESENCE OF OXYGEN
HIEBER, K
论文数:
0
引用数:
0
h-index:
0
机构:
SIEMENS AG,FORSCH LAB,BALAN STR 73,8 MUNICH 80,WEST GERMANY
HIEBER, K
LASSAK, L
论文数:
0
引用数:
0
h-index:
0
机构:
SIEMENS AG,FORSCH LAB,BALAN STR 73,8 MUNICH 80,WEST GERMANY
LASSAK, L
[J].
THIN SOLID FILMS,
1974,
20
(01)
: 63
-
73
[8]
STRESSES IN THIN-FILMS - RELEVANCE OF GRAIN-BOUNDARIES AND IMPURITIES
HOFFMAN, RW
论文数:
0
引用数:
0
h-index:
0
机构:
CASE WESTERN RESERVE UNIV,DEPT PHYS,CLEVELAND,OH 44106
CASE WESTERN RESERVE UNIV,DEPT PHYS,CLEVELAND,OH 44106
HOFFMAN, RW
[J].
THIN SOLID FILMS,
1976,
34
(02)
: 185
-
190
[9]
KIEFFER R, 1963, HARTSTOFFE, P156
[10]
INTRINSIC STRESS IN EVAPORATED METAL FILMS
KLOKHOLM, E
论文数:
0
引用数:
0
h-index:
0
KLOKHOLM, E
BERRY, BS
论文数:
0
引用数:
0
h-index:
0
BERRY, BS
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1968,
115
(08)
: 823
-
&
←
1
2
→
共 12 条
[1]
THERMAL EFFECTS DURING THE DEPOSITION OF THIN SILVER, GOLD AND COPPER-FILMS AND THEIR INFLUENCE ON INTERNAL-STRESS MEASUREMENTS
ABERMANN, R
论文数:
0
引用数:
0
h-index:
0
ABERMANN, R
MARTINZ, HP
论文数:
0
引用数:
0
h-index:
0
MARTINZ, HP
KRAMER, R
论文数:
0
引用数:
0
h-index:
0
KRAMER, R
[J].
THIN SOLID FILMS,
1980,
70
(01)
: 127
-
137
[2]
INSITU DETERMINATION OF THE STRUCTURE OF THIN METAL-FILMS BY INTERNAL-STRESS MEASUREMENTS - STRUCTURE DEPENDENCE OF SILVER AND COPPER-FILMS ON OXYGEN-PRESSURE DURING DEPOSITION
ABERMANN, R
论文数:
0
引用数:
0
h-index:
0
ABERMANN, R
KOCH, R
论文数:
0
引用数:
0
h-index:
0
KOCH, R
[J].
THIN SOLID FILMS,
1980,
66
(02)
: 217
-
232
[3]
STRUCTURE AND INTERNAL-STRESS IN ULTRATHIN SILVER FILMS DEPOSITED ON MGF2 AND SIO SUBSTRATES
ABERMANN, R
论文数:
0
引用数:
0
h-index:
0
ABERMANN, R
KRAMER, R
论文数:
0
引用数:
0
h-index:
0
KRAMER, R
MASER, J
论文数:
0
引用数:
0
h-index:
0
MASER, J
[J].
THIN SOLID FILMS,
1978,
52
(02)
: 215
-
229
[4]
ELECTRON-MICROSCOPE STRUCTURE AND INTERNAL-STRESS IN THIN SILVER AND GOLD-FILMS DEPOSITED ONTO MGF2 AND SIO SUBSTRATES
ABERMANN, R
论文数:
0
引用数:
0
h-index:
0
机构:
Institut für Physikalische Chemie der Universität Innsbruck, A-6020 Innsbruck
ABERMANN, R
KOCH, R
论文数:
0
引用数:
0
h-index:
0
机构:
Institut für Physikalische Chemie der Universität Innsbruck, A-6020 Innsbruck
KOCH, R
KRAMER, R
论文数:
0
引用数:
0
h-index:
0
机构:
Institut für Physikalische Chemie der Universität Innsbruck, A-6020 Innsbruck
KRAMER, R
[J].
THIN SOLID FILMS,
1979,
58
(02)
: 365
-
370
[5]
X-RAY PHOTOELECTRON STUDIES OF REACTION OF CLEAN METALS (MG, AL,CR,MN) WITH OXYGEN AND WATER-VAPOR
FUGGLE, JC
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV STRATHCLYDE,MET DEPT,GLASGOW G1 1XL,SCOTLAND
FUGGLE, JC
WATSON, LM
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV STRATHCLYDE,MET DEPT,GLASGOW G1 1XL,SCOTLAND
WATSON, LM
FABIAN, DJ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV STRATHCLYDE,MET DEPT,GLASGOW G1 1XL,SCOTLAND
FABIAN, DJ
AFFROSSMAN, S
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV STRATHCLYDE,MET DEPT,GLASGOW G1 1XL,SCOTLAND
AFFROSSMAN, S
[J].
SURFACE SCIENCE,
1975,
49
(01)
: 61
-
76
[6]
PHOTOEMISSION STUDY OF CHROMIUM(111) SURFACE INTERACTING WITH OXYGEN
GEWINNER, G
论文数:
0
引用数:
0
h-index:
0
GEWINNER, G
PERUCHETTI, JC
论文数:
0
引用数:
0
h-index:
0
PERUCHETTI, JC
JAEGLE, A
论文数:
0
引用数:
0
h-index:
0
JAEGLE, A
KALT, A
论文数:
0
引用数:
0
h-index:
0
KALT, A
[J].
SURFACE SCIENCE,
1978,
78
(02)
: 439
-
458
[7]
STRUCTURAL AND ELECTRICAL PROPERTIES OF CHROMIUM AND NICKEL FILMS EVAPORATED IN PRESENCE OF OXYGEN
HIEBER, K
论文数:
0
引用数:
0
h-index:
0
机构:
SIEMENS AG,FORSCH LAB,BALAN STR 73,8 MUNICH 80,WEST GERMANY
HIEBER, K
LASSAK, L
论文数:
0
引用数:
0
h-index:
0
机构:
SIEMENS AG,FORSCH LAB,BALAN STR 73,8 MUNICH 80,WEST GERMANY
LASSAK, L
[J].
THIN SOLID FILMS,
1974,
20
(01)
: 63
-
73
[8]
STRESSES IN THIN-FILMS - RELEVANCE OF GRAIN-BOUNDARIES AND IMPURITIES
HOFFMAN, RW
论文数:
0
引用数:
0
h-index:
0
机构:
CASE WESTERN RESERVE UNIV,DEPT PHYS,CLEVELAND,OH 44106
CASE WESTERN RESERVE UNIV,DEPT PHYS,CLEVELAND,OH 44106
HOFFMAN, RW
[J].
THIN SOLID FILMS,
1976,
34
(02)
: 185
-
190
[9]
KIEFFER R, 1963, HARTSTOFFE, P156
[10]
INTRINSIC STRESS IN EVAPORATED METAL FILMS
KLOKHOLM, E
论文数:
0
引用数:
0
h-index:
0
KLOKHOLM, E
BERRY, BS
论文数:
0
引用数:
0
h-index:
0
BERRY, BS
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1968,
115
(08)
: 823
-
&
←
1
2
→