INTERFACE IMAGING BY SCANNING INTERNAL PHOTOEMISSION

被引：22

作者：

DISTEFANO, TH ^{[1
]}

VIGGIANO, JM ^{[1
]}

机构：

[1] IBM CORP, THOMAS J WATSON RES CTR, PHYS SCI DEPT, YORKTOWN HEIGHTS, NY 10598 USA

来源：

关键词：

D O I：

10.1147/rd.182.0094

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：94 / 99

页数：6

共 11 条

[1]

Andrews H.C., 1970, Computer Techniques in Image Processing

[2]

CHOU NJ, PRIVATE COMMUNICATIO

DISTEFAN.TH .

[4]

DISTEFAN.TH, 1973, B AM PHYS SOC, V18, P133

[5] DIELECTRIC BREAKDOWN INDUCED BY SODIUM IN MOS STRUCTURES [J].

DISTEFANO, TH .

[6]

DISTEFANO TH, TO BE PUBLISHED

[7]

DISTEFANO TH, 1972, 32 ANN C PHYS EL ALB

[8]

SCHWUTTKE GH, 1973, DAHC15720274 CONTR

WILLIAMS, R ;

WOODS, MH .

WILLIAMS, R ;

WOODS, MH .