共 12 条
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ACCURATE DETERMINATION OF MISFIT STRAIN, LAYER THICKNESS, AND CRITICAL LAYER THICKNESS IN ULTRATHIN BURIED STRAINED INGAAS/GAAS LAYER BY X-RAY-DIFFRACTION
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JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
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INCORPORATION DESORPTION RATE VARIATION AT HETEROINTERFACES IN III-V MOLECULAR-BEAM EPITAXY
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JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1991, 9 (04)
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[9]
KLEIN WH, UNPUB