QUANTIFICATION AND MEASUREMENT BY AUGER-ELECTRON SPECTROSCOPY AND X-RAY PHOTOELECTRON-SPECTROSCOPY

被引：43

作者：

SEAH, MP

机构：

来源：

VACUUM | 1986年 / 36卷 / 7-9期

关键词：

D O I：

10.1016/0042-207X(86)90216-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：399 / 407

页数：9

共 77 条

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