ASYMMETRIC ELECTROSTATIC LENS FOR FIELD-EMISSION MICROPROBE APPLICATIONS

被引:107
作者
ORLOFF, J
SWANSON, LW
机构
[1] Oregon Graduate Center, Beaverton, OR 97005
关键词
D O I
10.1063/1.326260
中图分类号
O59 [应用物理学];
学科分类号
摘要
The properties of a physically asymmetric three-element electrostatic lens have been calculated numerically for voltage-symmetric and voltage-asymmetric cases. The lens has low chromatic aberration, Cc∞/f < 0.5, when operated in the voltage-asymmetric mode with voltage ratios Vfinal/Vinitial as low as 2. Calculations of beam diameter versus current with realistic field electron emission parameters of dI/dΩ=1 mA sr-1 and ΔE=2 eV at 5 kV emitter voltage show that at 30-kV final-beam voltage 250 nA current could be focused into a 0.25-μm spot at 5 cm working distance, with an emitter-lens separation of 1.5 cm. It is shown that while the two-element immersion lens is inappropriate for high-current microprobe applications, the three-element asymmetric lens is well suited for this work.
引用
收藏
页码:2494 / 2501
页数:8
相关论文
共 22 条
[1]   ELECTRON GUN USING A FIELD EMISSION SOURCE [J].
CREWE, AV ;
EGGENBER.DN ;
WALL, J ;
WELTER, LM .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (04) :576-&
[2]   A HIGH-RESOLUTION SCANNING TRANSMISSION ELECTRON MICROSCOPE [J].
CREWE, AV ;
WALL, J ;
WELTER, LM .
JOURNAL OF APPLIED PHYSICS, 1968, 39 (13) :5861-&
[3]   The color difference in electron lenses. [J].
Glaser, Walter .
ZEITSCHRIFT FUR PHYSIK, 1940, 116 (1-2) :56-67
[4]  
GRIVET P, 1972, ELECTRON OPTICS, P179
[5]   A 3-APERTURE ELECTRON OPTICAL LENS FOR PRODUCING AN IMAGE OF VARIABLE ENERGY BUT FIXED POSITION [J].
IMHOF, RE ;
READ, FH .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1968, 1 (08) :859-&
[6]   ION-SOURCE OF HIGH BRIGHTNESS USING LIQUID-METAL [J].
KROHN, VE ;
RINGO, GR .
APPLIED PHYSICS LETTERS, 1975, 27 (09) :479-481
[7]   3-ANODE ACCELERATING LENS SYSTEM FOR FIELD-EMISSION SCANNING ELECTRON-MICROSCOPE [J].
KURODA, K ;
EBISUI, H ;
SUZUKI, T .
JOURNAL OF APPLIED PHYSICS, 1974, 45 (05) :2336-2342
[8]   ANALYSIS OF ACCELERATING LENS SYSTEM IN FIELD-EMISSION SCANNING ELECTRON-MICROSCOPE [J].
KURODA, K ;
SUZUKI, T .
JOURNAL OF APPLIED PHYSICS, 1974, 45 (03) :1436-1441
[9]   3-ANODE ACCELERATING LENS SYSTEM FOR FIELD-EMISSION SCANNING ELECTRON-MICROSCOPY (II) [J].
KURODA, K ;
SUZUKI, T .
APPLIED PHYSICS LETTERS, 1974, 25 (01) :23-24
[10]  
MULLER EW, 1964, J CHEM PHYS, V41, P3279