CONSTRUCTION AND PERFORMANCE OF AN FIM-ATOM PROBE

被引:80
作者
BRENNER, SS
MCKINNEY, JT
机构
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D O I
10.1016/0039-6028(70)90007-5
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
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页码:88 / &
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[11]   FIELD ADSORPTION AND DESORPTION OF HELIUM AND NEON [J].
MULLER, EW ;
MCLANE, SB ;
PANITZ, JA .
SURFACE SCIENCE, 1969, 17 (02) :430-&
[12]   ATOM-PROBE FIELD ION MICROSCOPE [J].
MULLER, EW ;
PANITZ, JA ;
MCLANE, SB .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (01) :83-&
[13]   FIELD-ION MICROSCOPY AND ELECTRONIC STRUCTURE OF METAL SURFACES [J].
MULLER, EW .
QUARTERLY REVIEWS, 1969, 23 (02) :177-&
[14]  
MULLER EW, 1967, 14 FIELD EM S WASH
[15]   CALIBRATION OF ATOM PROBE FIM [J].
PANITZ, JA ;
MCLANE, SB ;
MULLER, EW .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (10) :1321-&
[16]   USE OF A CHANNELLED IMAGE INTENSIFIER IN FIELD-ION MICROSCOPE [J].
TURNER, PJ ;
CARTWRIGHT, P ;
SOUTHON, MJ ;
VANOOSTR.A ;
MANLEY, BW .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (08) :731-+
[17]   ION DETECTION USING A CONTINUOUS CHANNEL ELECTRON MULTIPLIER [J].
YELLIN, E ;
YIN, LI ;
ADLER, I .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1970, 41 (01) :18-+