THE RELATIVE IMPORTANCE OF ELASTIC AND INELASTIC-SCATTERING IN ANGLE-RESOLVED AUGER-ELECTRON SPECTROSCOPY - A RESPONSE

被引：9

作者：

CHAMBERS, SA

机构：

[1] Boeing High Technology Center, Seattle

来源：

LANGMUIR | 1990年 / 6卷 / 08期

关键词：

D O I：

10.1021/la00098a018

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The importance of elastic scattering and interference in creating the modulation observed in angle-resolved Auger electron spectroscopy is discussed, along with the conceptual similarity between the scattering of Auger and photoelectron waves. While inelastic scattering is certainly important, the angular dependence of the associated cross sections is considerably less pronounced than that associated with elastic scattering. These results, which have been firmly established in the past decade, are at odds with recent claims by Frank et al. (Frank, D. G.; Batina, N.; McCargar, J. W.; Hubbard, A. T. Langmuir 1989, 5, 1141). © 1990, American Chemical Society. All rights reserved.

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页码：1427 / 1430

页数：4

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共 33 条

[1] ANGULAR RESOLVED AUGER EMISSION FROM CRYSTAL-SURFACES - NEW EXPERIMENTAL RESULTS AND PREDICTIONS FROM A SIMPLE-MODEL [J].

ABERDAM, D ;

BAUDOING, R ;

BLANC, E ;

GAUBERT, C .

SURFACE SCIENCE, 1978, 71 (02) :279-305

[2] DOPANT INCORPORATION, FERMI-LEVEL MOVEMENT, AND BAND OFFSET AT THE GE/GAAS(001) INTERFACE [J].

CHAMBERS, SA ;

IRWIN, TJ .

PHYSICAL REVIEW B, 1988, 38 (11) :7858-7861

[3] MEDIUM-ENERGY BACKSCATTERED ELECTRON-DIFFRACTION AS A PROBE OF ELASTIC STRAIN IN EPITAXIAL OVERLAYERS [J].

CHAMBERS, SA ;

VITOMIROV, IM ;

ANDERSON, SB ;

WEAVER, JH .

PHYSICAL REVIEW B, 1987, 35 (05) :2490-2493

[4] STRUCTURAL CHARACTERIZATION OF METAL-METAL INTERFACES BY INTERMEDIATE-ENERGY AUGER-ELECTRON DIFFRACTION [J].

CHAMBERS, SA ;

ANDERSON, SB ;

WEAVER, JH .

PHYSICAL REVIEW B, 1985, 32 (08) :4872-4875

[5] GROWTH OF METASTABLE FCC CO ON NI(001) [J].

CHAMBERS, SA ;

ANDERSON, SB ;

CHEN, HW ;

WEAVER, JH .

PHYSICAL REVIEW B, 1987, 35 (06) :2592-2597

[6] SIMULTANEOUS EPITAXY AND SUBSTRATE OUT-DIFFUSION AT A METAL-SEMICONDUCTOR INTERFACE - FE/GAAS(001)-C(8X2) [J].

CHAMBERS, SA ;

XU, F ;

CHEN, HW ;

VITOMIROV, IM ;

ANDERSON, SB ;

WEAVER, JH .

PHYSICAL REVIEW B, 1986, 34 (10) :6605-6611

[7] HIGH-ENERGY AUGER AND MEDIUM-ENERGY BACKSCATTERED ELECTRON-DIFFRACTION AS A PROBE OF ULTRA-THIN EPITAXIAL OVERLAYERS, SANDWICHES AND SUPERLATTICES [J].

CHAMBERS, SA ;

VITOMIROV, IM ;

ANDERSON, SB ;

CHEN, HW ;

WAGENER, TJ ;

WEAVER, JH .

SUPERLATTICES AND MICROSTRUCTURES, 1987, 3 (05) :563-571

[8] HIGH-TEMPERATURE NUCLEATION AND SILICIDE FORMATION AT THE CO/SI(111)-7X7 INTERFACE - A STRUCTURAL INVESTIGATION [J].

CHAMBERS, SA ;

ANDERSON, SB ;

CHEN, HW ;

WEAVER, JH .

PHYSICAL REVIEW B, 1986, 34 (02) :913-920

[9] ANGLE-RESOLVED AUGER-ELECTRON EMISSION FROM LAB6(001) WITH AND WITHOUT CHEMISORBED OXYGEN [J].

CHAMBERS, SA ;

SWANSON, LW .

SURFACE SCIENCE, 1983, 131 (2-3) :385-402

[10] FORMATION AND STRUCTURE OF FE/CU(001) INTERFACES, SANDWICHES, AND SUPERLATTICES [J].

CHAMBERS, SA ;

WAGENER, TJ ;

WEAVER, JH .

PHYSICAL REVIEW B, 1987, 36 (17) :8992-9002

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