OPTICAL CHARACTERIZATION OF THIN-FILMS

被引：11

作者：

ANDERSON, WJ

HANSEN, WN

机构：

[1] USAF, AVION LAB, WRIGHT PATTERSON AFB, OH 45433 USA

[2] UTAH STATE UNIV, LOGAN, UT 84322 USA

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1977年 / 67卷 / 08期

关键词：

D O I：

10.1364/JOSA.67.001051

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1051 / 1058

页数：8

共 21 条

[1]

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[3]

Bennet H.E., 1967, PHYS THIN FILMS, V4, P1

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PORTEUS, JO .

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[5] OPTICAL CONSTANTS OF SILVER SULFIDE TARNISH FILMS [J].

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ASHLEY, EJ .

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[6]

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[7] EFFECT OF THIN SURFACE FILM ON ELLIPSOMETRIC DETERMINATION OF OPTICAL CONSTANTS [J].

BURGE, DK ;

BENNETT, HE .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1964, 54 (12) :1428-&

[8]

DAVEY JE, 1965, J APPL PHYS, V9, P359

[9] Interpretation of the anomalies of the optical constants of thin metal layers. [J].

David, Erwin .

ZEITSCHRIFT FUR PHYSIK, 1939, 114 (7-8) :389-406

[10] OPTICAL PROPERTIES OF AMORPHOUS GERMANIUM FILMS [J].

DONOVAN, TM ;

SPICER, WE ;

BENNETT, JM ;

ASHLEY, EJ .

PHYSICAL REVIEW B, 1970, 2 (02) :397-&

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