SCANNING PHOTOELECTRON MICROSCOPY WITH UNDULATOR RADIATION - A SUCCESSFUL TEST ON UNCOATED NEURONS

被引：11

作者：

DE STASIO, G

NG, W

RAYCHAUDHURI, AK

COLE, RK

GUO, ZY

WALLACE, J

MARGARITONDO, G

CERRINA, F

UNDERWOOD, J

PERERA, R

KORTRIGHT, J

MERCANTI, D

CIOTTI, MT

机构：

[1] UNIV WISCONSIN, DEPT PHYS, MADISON, WI 53706 USA

[2] UNIV WISCONSIN, DEPT ELECT & COMP ENGN, MADISON, WI 53706 USA

[3] UNIV WISCONSIN, CTR SYNCHROTRON RADIAT, MADISON, WI 53706 USA

[4] UNIV CALIF BERKELEY LAWRENCE BERKELEY LAB, CTR XRAY OPT, BERKELEY, CA 94720 USA

[5] CNR, IST NEUROBIOL, I-00100 ROME, ITALY

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1990年 / 294卷 / 1-2期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0168-9002(90)91851-2

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We present the results of the first test of scanning photoelectron microscopy of biological cells. The results were obtained with the recently commissioned X-ray photoemission microscope MAXIMUM at the Wisconsin synchrotron radiation center, based on an undulator source of photons and on normal-incidence focussing of the photon beam. Several photoelectron micrographs were taken of rate neurons, prepared without metal coating and without labelling agents. The results were compared with visible micrographs produced by the same instrument, and successfully tested for reproducibility over long periods of time. © 1990.

引用

页码：351 / 354

页数：4

共 21 条

[11] KUNZ LC, 1988, 1987 HAS ANN REP, P366
[12] Lai B., 1985, Proceedings of the SPIE - The International Society for Optical Engineering, V563, P174, DOI 10.1117/12.949666
[13] LOVAS I, 1980, P SOC PHOTOOPT INSTR, V316, P90
[14] MARGARITONDO G, IN PRESS NUCL INSTR
[15] Margaritondo G., 1988, INTRO SYNCHROTRON RA
[16] SCANNING-X-RAY MICROSCOPE WITH 75-NM RESOLUTION
RARBACK, H
SHU, D
FENG, SC
ADE, H
KIRZ, J
MCNULTY, I
KERN, DP
CHANG, THP
VLADIMIRSKY, Y
ISKANDER, N
ATTWOOD, D
MCQUAID, K
ROTHMAN, S
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (01) : 52 - 59
[17] SCHWARZSCHILD K, 1905, GOTTINGEN MITT, V10, P2
[18] SPILLER E, 1980, SCANNED IMAGE MICROS, P365
[19] TRAIL JA, 1985, SOC P INSTRUM ENG, V563, P90
[20] X-RAY-IMAGING OF NANOSTRUCTURE PATTERNS
VLADIMIRSKY, Y
KERN, D
MEYERILSE, W
ATTWOOD, D
[J]. APPLIED PHYSICS LETTERS, 1989, 54 (03) : 286 - 288

← 1 2 3 →