INVERTED-VERTICAL OMVPE REACTOR - DESIGN AND CHARACTERIZATION

被引:7
作者
PARSONS, JD
机构
[1] Department of Applied Physics and Electrical Engineering, Oregon Graduate Institute of Science and Technology, Beaverton
关键词
D O I
10.1016/0022-0248(92)90648-3
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
An inverted-vertical (IV) OMVPE reactor design is presented. Optimum flow rates are discussed as a function of reactor dimensions and operating pressure. The performance of the IV reactor design is characterized by the purity, thickness uniformity, composition uniformity and electrical uniformity of GaAs and (AlGa)As epilayers and device structures grown on 2 inch diameter GaAs substrates. Device results were obtained from low and high frequency testing of GaAs MESFETs fabricated in MESFET structures grown in the IV reactor.
引用
收藏
页码:387 / 396
页数:10
相关论文
共 31 条
[1]  
ARNDT HH, 1972, Patent No. 3704987
[2]  
BAN VS, 1977, Patent No. 4062318
[3]   HEAT AND MASS-TRANSFER IN HORIZONTAL VAPOR-PHASE EPITAXY REACTORS [J].
CHEN, K .
JOURNAL OF CRYSTAL GROWTH, 1984, 70 (1-2) :64-72
[4]   A MATHEMATICAL REPRESENTATION OF A MODIFIED STAGNATION FLOW REACTOR FOR MOCVD APPLICATIONS [J].
DILAWARI, AH ;
SZEKELY, J .
JOURNAL OF CRYSTAL GROWTH, 1991, 108 (3-4) :491-498
[5]  
Dozier A. R., 1978, US Patent, Patent No. [4,108,106, 4108106]
[6]  
DUNN GL, 1979, THESIS UCLA
[7]   COMPLEX FLOW PHENOMENA IN VERTICAL MOCVD REACTORS - EFFECTS ON DEPOSITION UNIFORMITY AND INTERFACE ABRUPTNESS [J].
FOTIADIS, DI ;
KREMER, AM ;
MCKENNA, DR ;
JENSEN, KF .
JOURNAL OF CRYSTAL GROWTH, 1987, 85 (1-2) :154-164
[8]  
Giling L. J., 1985, Crystal Growth of Electronic Materials. 5th International Summer School on Crystal Growth and Materials Research, P71
[9]   HETEROGENEOUS KINETICS AND MASS-TRANSPORT IN CHEMICAL VAPOR-DEPOSITION PROCESSES .2. APPLICATION TO SILICON EPITAXY [J].
HITCHMAN, ML ;
CURTIS, BJ .
PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, 1981, 4 (03) :283-296
[10]  
HOWE WE, 1972, Patent No. 3633537