AVALANCHE REGION WIDTH IN VARIOUS STRUCTURES OF IMPATT DIODES

被引:35
作者
SCHROEDER, WE
HADDAD, GI
机构
来源
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS | 1971年 / 59卷 / 08期
关键词
D O I
10.1109/PROC.1971.8372
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:1245 / +
页数:1
相关论文
共 11 条
[1]   AVALANCHE BREAKDOWN IN READ DIODES AND PIN DIODES [J].
GIBBONS, G ;
SZE, SM .
SOLID-STATE ELECTRONICS, 1968, 11 (02) :225-+
[2]  
HOWARD NR, 1962, J ELECTRON CONTR, V13, P537
[3]  
KIM CK, PRIVATE COMMUNICATIO
[4]   IONIZATION RATES OF HOLES + ELECTRONS IN SILICON [J].
LEE, CA ;
KLEIMACK, JJ ;
BATDORF, RL ;
WIEGMANN, W ;
LOGAN, RA .
PHYSICAL REVIEW, 1964, 134 (3A) :A761-+
[5]   AVALANCHE BREAKDOWN IN GERMANIUM [J].
MILLER, SL .
PHYSICAL REVIEW, 1955, 99 (04) :1234-1241
[7]   MINORITY CARRIER STORAGE AND OSCILLATION EFFICIENCY IN READ DIODES [J].
MISAWA, T .
SOLID-STATE ELECTRONICS, 1970, 13 (10) :1369-&
[8]  
MOLL JL, 1964, PHYSICS SEMICONDUCTO
[9]  
NOBEL DD, 1969, DEC AV DIOD WORKSH
[10]  
SEIDEL TE, 1970, OCT IEEE INT EL DEV