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LDD MOSFETS USING DISPOSABLE SIDEWALL SPACER TECHNOLOGY
被引:7
作者
:
PFIESTER, JR
论文数:
0
引用数:
0
h-index:
0
机构:
Motorola, Austin, TX, USA, Motorola, Austin, TX, USA
PFIESTER, JR
机构
:
[1]
Motorola, Austin, TX, USA, Motorola, Austin, TX, USA
来源
:
IEEE ELECTRON DEVICE LETTERS
|
1988年
/ 9卷
/ 04期
关键词
:
DISPOSABLE SIDEWALK SPACER TECHNOLOGY - LDD MOSFET - LIGHTLY-DOPES DRAIN (LDD);
D O I
:
10.1109/55.685
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:189 / 192
页数:4
相关论文
共 4 条
[1]
OPTIMUM DESIGN OF N+-N- DOUBLE-DIFFUSED DRAIN MOSFET TO REDUCE HOT-CARRIER EMISSION
[J].
KOYANAGI, M
论文数:
0
引用数:
0
h-index:
0
KOYANAGI, M
;
KANEKO, H
论文数:
0
引用数:
0
h-index:
0
KANEKO, H
;
SHIMIZU, S
论文数:
0
引用数:
0
h-index:
0
SHIMIZU, S
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1985,
32
(03)
:562
-570
[2]
DESIGN AND CHARACTERISTICS OF THE LIGHTLY DOPED DRAIN-SOURCE (LDD) INSULATED GATE FIELD-EFFECT TRANSISTOR
[J].
OGURA, S
论文数:
0
引用数:
0
h-index:
0
OGURA, S
;
TSANG, PJ
论文数:
0
引用数:
0
h-index:
0
TSANG, PJ
;
WALKER, WW
论文数:
0
引用数:
0
h-index:
0
WALKER, WW
;
CRITCHLOW, DL
论文数:
0
引用数:
0
h-index:
0
CRITCHLOW, DL
;
SHEPARD, JF
论文数:
0
引用数:
0
h-index:
0
SHEPARD, JF
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(08)
:1359
-1367
[3]
PFIESTER JR, UNPUB
[4]
FABRICATION OF HIGH-PERFORMANCE LDDFETS WITH OXIDE SIDEWALL-SPACER TECHNOLOGY
[J].
TSANG, PJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, DIV GEN TECHNOL, ESSEX JUNCTION, VT 05452 USA
IBM CORP, DIV GEN TECHNOL, ESSEX JUNCTION, VT 05452 USA
TSANG, PJ
;
OGURA, S
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, DIV GEN TECHNOL, ESSEX JUNCTION, VT 05452 USA
IBM CORP, DIV GEN TECHNOL, ESSEX JUNCTION, VT 05452 USA
OGURA, S
;
WALKER, WW
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, DIV GEN TECHNOL, ESSEX JUNCTION, VT 05452 USA
IBM CORP, DIV GEN TECHNOL, ESSEX JUNCTION, VT 05452 USA
WALKER, WW
;
SHEPARD, JF
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, DIV GEN TECHNOL, ESSEX JUNCTION, VT 05452 USA
IBM CORP, DIV GEN TECHNOL, ESSEX JUNCTION, VT 05452 USA
SHEPARD, JF
;
CRITCHLOW, DL
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, DIV GEN TECHNOL, ESSEX JUNCTION, VT 05452 USA
IBM CORP, DIV GEN TECHNOL, ESSEX JUNCTION, VT 05452 USA
CRITCHLOW, DL
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1982,
29
(04)
:590
-596
←
1
→
共 4 条
[1]
OPTIMUM DESIGN OF N+-N- DOUBLE-DIFFUSED DRAIN MOSFET TO REDUCE HOT-CARRIER EMISSION
[J].
KOYANAGI, M
论文数:
0
引用数:
0
h-index:
0
KOYANAGI, M
;
KANEKO, H
论文数:
0
引用数:
0
h-index:
0
KANEKO, H
;
SHIMIZU, S
论文数:
0
引用数:
0
h-index:
0
SHIMIZU, S
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1985,
32
(03)
:562
-570
[2]
DESIGN AND CHARACTERISTICS OF THE LIGHTLY DOPED DRAIN-SOURCE (LDD) INSULATED GATE FIELD-EFFECT TRANSISTOR
[J].
OGURA, S
论文数:
0
引用数:
0
h-index:
0
OGURA, S
;
TSANG, PJ
论文数:
0
引用数:
0
h-index:
0
TSANG, PJ
;
WALKER, WW
论文数:
0
引用数:
0
h-index:
0
WALKER, WW
;
CRITCHLOW, DL
论文数:
0
引用数:
0
h-index:
0
CRITCHLOW, DL
;
SHEPARD, JF
论文数:
0
引用数:
0
h-index:
0
SHEPARD, JF
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1980,
27
(08)
:1359
-1367
[3]
PFIESTER JR, UNPUB
[4]
FABRICATION OF HIGH-PERFORMANCE LDDFETS WITH OXIDE SIDEWALL-SPACER TECHNOLOGY
[J].
TSANG, PJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, DIV GEN TECHNOL, ESSEX JUNCTION, VT 05452 USA
IBM CORP, DIV GEN TECHNOL, ESSEX JUNCTION, VT 05452 USA
TSANG, PJ
;
OGURA, S
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, DIV GEN TECHNOL, ESSEX JUNCTION, VT 05452 USA
IBM CORP, DIV GEN TECHNOL, ESSEX JUNCTION, VT 05452 USA
OGURA, S
;
WALKER, WW
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, DIV GEN TECHNOL, ESSEX JUNCTION, VT 05452 USA
IBM CORP, DIV GEN TECHNOL, ESSEX JUNCTION, VT 05452 USA
WALKER, WW
;
SHEPARD, JF
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, DIV GEN TECHNOL, ESSEX JUNCTION, VT 05452 USA
IBM CORP, DIV GEN TECHNOL, ESSEX JUNCTION, VT 05452 USA
SHEPARD, JF
;
CRITCHLOW, DL
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, DIV GEN TECHNOL, ESSEX JUNCTION, VT 05452 USA
IBM CORP, DIV GEN TECHNOL, ESSEX JUNCTION, VT 05452 USA
CRITCHLOW, DL
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1982,
29
(04)
:590
-596
←
1
→