INSITU DOPING BY AS ION-IMPLANTATION OF SILICON GROWN BY MOLECULAR-BEAM EPITAXY

被引:13
作者
DENHOFF, MW [1 ]
HOUGHTON, DC [1 ]
JACKMAN, TE [1 ]
SWANSON, ML [1 ]
PARIKH, NR [1 ]
机构
[1] UNIV N CAROLINA,DEPT PHYS & ASTRON,CHAPEL HILL,NC 27599
关键词
D O I
10.1063/1.341350
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:3938 / 3944
页数:7
相关论文
共 28 条
  • [1] GROWTH AND CHARACTERIZATION OF SI1-XGEX AND GE EPILAYERS ON (100) SI
    BARIBEAU, JM
    JACKMAN, TE
    HOUGHTON, DC
    MAIGNE, P
    DENHOFF, MW
    [J]. JOURNAL OF APPLIED PHYSICS, 1988, 63 (12) : 5738 - 5746
  • [2] SILICON MBE APPARATUS FOR UNIFORM HIGH-RATE DEPOSITION ON STANDARD FORMAT WAFERS
    BEAN, JC
    SADOWSKI, EA
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 20 (02): : 137 - 142
  • [3] THE N-CHANNEL SIGE/SI MODULATION-DOPED FIELD-EFFECT TRANSISTOR
    DAEMBKES, H
    HERZOG, HJ
    JORKE, H
    KIBBEL, H
    KASPAR, E
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1986, 33 (05) : 633 - 638
  • [4] DENHOFF MW, UNPUB
  • [5] DESIGN OF ION-IMPLANTED MOSFETS WITH VERY SMALL PHYSICAL DIMENSIONS
    DENNARD, RH
    GAENSSLEN, FH
    YU, HN
    RIDEOUT, VL
    BASSOUS, E
    LEBLANC, AR
    [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1974, SC 9 (05) : 256 - 268
  • [6] FELDMAN LC, 1982, MATERIALS ANAL USING
  • [7] A LOW-ENERGY METAL-ION SOURCE FOR PRIMARY ION DEPOSITION AND ACCELERATED ION DOPING DURING MOLECULAR-BEAM EPITAXY
    HASAN, MA
    KNALL, J
    BARNETT, SA
    ROCKETT, A
    SUNDGREN, JE
    GREENE, JE
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (05): : 1332 - 1339
  • [8] HOUGHTON DC, 1987, SILICON MBE, V2, P561
  • [9] HOYT JL, 1986, MATER RES SOC S P, V52, P15
  • [10] JACKMAN TE, UNPUB