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RECENT ADVANCES IN X-RAY DETECTION TECHNOLOGY

被引：26
作者：
AITKEN, DW
机构：
[1] Department of Physics and High Energy Physics Laboratory Stanford University, Stanford, California
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1968年 / NS15卷 / 03期
关键词：
D O I：
10.1109/TNS.1968.4324913
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A review is presented of recent developments in x-ray photon detectors and in the associated detector electronics. The first portion of the paper is devoted to a survey of the presently available physical information on the “intrinsic” resolution of silicon and germanium radiation detectors, proportional counters and NaI(Tl) scintillation crystals. Semiconductor detectors suitable for x-ray applications and low noise electronics are then analyzed in some detail. Discussions follow on scintillation detectors, proportional counters, and “external” photo-electric detectors. Recent spectral achievements and interesting applications are illustrated. Copyright © 1968 by The Institute of Electrical and Electronics Engineers, Inc.
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页码：10 / +
页数：1
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