学术探索
学术期刊
新闻热点
数据分析
智能评审
立即登录
NOTE ON EVALUATION OF SCHOTTKY DIODE PARAMETERS IN PRESENCE OF AN INTERFACIAL LAYER
被引:20
作者
:
ASHOK, S
论文数:
0
引用数:
0
h-index:
0
ASHOK, S
BORREGO, JM
论文数:
0
引用数:
0
h-index:
0
BORREGO, JM
GUTMANN, RJ
论文数:
0
引用数:
0
h-index:
0
GUTMANN, RJ
机构
:
来源
:
ELECTRONICS LETTERS
|
1978年
/ 14卷
/ 11期
关键词
:
D O I
:
10.1049/el:19780225
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:332 / 333
页数:2
相关论文
共 10 条
[1]
STUDIES OF TUNNEL MOS DIODES .1. INTERFACE EFFECTS IN SILICON SCHOTTKY DIODES
CARD, HC
论文数:
0
引用数:
0
h-index:
0
CARD, HC
RHODERICK, EH
论文数:
0
引用数:
0
h-index:
0
RHODERICK, EH
[J].
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
1971,
4
(10)
: 1589
-
+
[2]
MEASUREMENT OF CARRIER-CONCENTRATION PROFILES IN EPITAXIAL INDIUM PHOSPHIDE
CARDWELL, MJ
论文数:
0
引用数:
0
h-index:
0
机构:
PLESSEY CO LTD,ALLEN CLARK RES CTR,TOWCESTER,NORTHAMPTONSHIR,ENGLAND
PLESSEY CO LTD,ALLEN CLARK RES CTR,TOWCESTER,NORTHAMPTONSHIR,ENGLAND
CARDWELL, MJ
PEART, RF
论文数:
0
引用数:
0
h-index:
0
机构:
PLESSEY CO LTD,ALLEN CLARK RES CTR,TOWCESTER,NORTHAMPTONSHIR,ENGLAND
PLESSEY CO LTD,ALLEN CLARK RES CTR,TOWCESTER,NORTHAMPTONSHIR,ENGLAND
PEART, RF
[J].
ELECTRONICS LETTERS,
1973,
9
(04)
: 88
-
89
[3]
GAAS CHARGE-COUPLED-DEVICES
DEYHIMY, I
论文数:
0
引用数:
0
h-index:
0
DEYHIMY, I
HARRIS, JS
论文数:
0
引用数:
0
h-index:
0
HARRIS, JS
EDEN, RC
论文数:
0
引用数:
0
h-index:
0
EDEN, RC
EDWALL, DD
论文数:
0
引用数:
0
h-index:
0
EDWALL, DD
ANDERSON, SJ
论文数:
0
引用数:
0
h-index:
0
ANDERSON, SJ
BUBULAC, LO
论文数:
0
引用数:
0
h-index:
0
BUBULAC, LO
[J].
APPLIED PHYSICS LETTERS,
1978,
32
(06)
: 383
-
385
[4]
ELECTRICAL PROPERTIES OF NICKEL-LOW-DOPED N-TYPE GALLIUM-ARSENIDE SCHOTTKY-BARRIER DIODES
HACKAM, R
论文数:
0
引用数:
0
h-index:
0
HACKAM, R
HARROP, P
论文数:
0
引用数:
0
h-index:
0
HARROP, P
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1972,
ED19
(12)
: 1231
-
+
[5]
TEMPERATURE ANOMALIES OF SCHOTTKY-BARRIER DIODES ON N-TYPE SILICON
JAGER, D
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MUNSTER, INST APPL PHYS, D-4400 MUNSTER, GERMANY
UNIV MUNSTER, INST APPL PHYS, D-4400 MUNSTER, GERMANY
JAGER, D
KASSING, R
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MUNSTER, INST APPL PHYS, D-4400 MUNSTER, GERMANY
UNIV MUNSTER, INST APPL PHYS, D-4400 MUNSTER, GERMANY
KASSING, R
[J].
JOURNAL OF APPLIED PHYSICS,
1977,
48
(10)
: 4413
-
4414
[6]
KELLNER W, 1977, P IEEE INT ELECTRON, P599
[7]
Smith B. L., 1969, British Journal of Applied Physics (Journal of Physics D), V2, P465
[8]
TECHNOLOGY OF GAAS METAL-OXIDE-SEMICONDUCTOR SOLAR-CELLS
STIRN, RJ
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,JET PROP LAB,PASADENA,CA 91103
CALTECH,JET PROP LAB,PASADENA,CA 91103
STIRN, RJ
YEH, YCM
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,JET PROP LAB,PASADENA,CA 91103
CALTECH,JET PROP LAB,PASADENA,CA 91103
YEH, YCM
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1977,
24
(04)
: 476
-
483
[9]
SZE SM, 1969, PHYSICS SEMICONDUCTO, P393
[10]
WADA A, 1978, ELECTRON LETT, V14, P125
←
1
→
共 10 条
[1]
STUDIES OF TUNNEL MOS DIODES .1. INTERFACE EFFECTS IN SILICON SCHOTTKY DIODES
CARD, HC
论文数:
0
引用数:
0
h-index:
0
CARD, HC
RHODERICK, EH
论文数:
0
引用数:
0
h-index:
0
RHODERICK, EH
[J].
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
1971,
4
(10)
: 1589
-
+
[2]
MEASUREMENT OF CARRIER-CONCENTRATION PROFILES IN EPITAXIAL INDIUM PHOSPHIDE
CARDWELL, MJ
论文数:
0
引用数:
0
h-index:
0
机构:
PLESSEY CO LTD,ALLEN CLARK RES CTR,TOWCESTER,NORTHAMPTONSHIR,ENGLAND
PLESSEY CO LTD,ALLEN CLARK RES CTR,TOWCESTER,NORTHAMPTONSHIR,ENGLAND
CARDWELL, MJ
PEART, RF
论文数:
0
引用数:
0
h-index:
0
机构:
PLESSEY CO LTD,ALLEN CLARK RES CTR,TOWCESTER,NORTHAMPTONSHIR,ENGLAND
PLESSEY CO LTD,ALLEN CLARK RES CTR,TOWCESTER,NORTHAMPTONSHIR,ENGLAND
PEART, RF
[J].
ELECTRONICS LETTERS,
1973,
9
(04)
: 88
-
89
[3]
GAAS CHARGE-COUPLED-DEVICES
DEYHIMY, I
论文数:
0
引用数:
0
h-index:
0
DEYHIMY, I
HARRIS, JS
论文数:
0
引用数:
0
h-index:
0
HARRIS, JS
EDEN, RC
论文数:
0
引用数:
0
h-index:
0
EDEN, RC
EDWALL, DD
论文数:
0
引用数:
0
h-index:
0
EDWALL, DD
ANDERSON, SJ
论文数:
0
引用数:
0
h-index:
0
ANDERSON, SJ
BUBULAC, LO
论文数:
0
引用数:
0
h-index:
0
BUBULAC, LO
[J].
APPLIED PHYSICS LETTERS,
1978,
32
(06)
: 383
-
385
[4]
ELECTRICAL PROPERTIES OF NICKEL-LOW-DOPED N-TYPE GALLIUM-ARSENIDE SCHOTTKY-BARRIER DIODES
HACKAM, R
论文数:
0
引用数:
0
h-index:
0
HACKAM, R
HARROP, P
论文数:
0
引用数:
0
h-index:
0
HARROP, P
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1972,
ED19
(12)
: 1231
-
+
[5]
TEMPERATURE ANOMALIES OF SCHOTTKY-BARRIER DIODES ON N-TYPE SILICON
JAGER, D
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MUNSTER, INST APPL PHYS, D-4400 MUNSTER, GERMANY
UNIV MUNSTER, INST APPL PHYS, D-4400 MUNSTER, GERMANY
JAGER, D
KASSING, R
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MUNSTER, INST APPL PHYS, D-4400 MUNSTER, GERMANY
UNIV MUNSTER, INST APPL PHYS, D-4400 MUNSTER, GERMANY
KASSING, R
[J].
JOURNAL OF APPLIED PHYSICS,
1977,
48
(10)
: 4413
-
4414
[6]
KELLNER W, 1977, P IEEE INT ELECTRON, P599
[7]
Smith B. L., 1969, British Journal of Applied Physics (Journal of Physics D), V2, P465
[8]
TECHNOLOGY OF GAAS METAL-OXIDE-SEMICONDUCTOR SOLAR-CELLS
STIRN, RJ
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,JET PROP LAB,PASADENA,CA 91103
CALTECH,JET PROP LAB,PASADENA,CA 91103
STIRN, RJ
YEH, YCM
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,JET PROP LAB,PASADENA,CA 91103
CALTECH,JET PROP LAB,PASADENA,CA 91103
YEH, YCM
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1977,
24
(04)
: 476
-
483
[9]
SZE SM, 1969, PHYSICS SEMICONDUCTO, P393
[10]
WADA A, 1978, ELECTRON LETT, V14, P125
←
1
→