ION-SPACE-CHARGE INITIATION OF GATED FIELD EMITTER FAILURE

被引：8

作者：

MCGRUER, NE

BROWNING, J

MEASSICK, S

GILMORE, M

BINTZ, WJ

CHAN, C

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1993年 / 11卷 / 02期

关键词：

D O I：

10.1116/1.586880

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Failures of individual micron-scale gated field emitters are observed to be similar in many respects to cathodic arcs. The initiation of a failure event at elevated pressures by ion-space-charge enhancement of the electric field at the emitter tip is simulated and compared with experimental results. The experimental results show a significantly lower pressure failure threshold than that predicted by the simulation. This discrepancy may indicate the presence of additional processes.

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页码：441 / 444

页数：4

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