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NOISE CAUSED BY GAAS-MESFETS IN OPTICAL RECEIVERS
被引:54
作者
:
OGAWA, K
论文数:
0
引用数:
0
h-index:
0
OGAWA, K
机构
:
来源
:
BELL SYSTEM TECHNICAL JOURNAL
|
1981年
/ 60卷
/ 06期
关键词
:
D O I
:
10.1002/j.1538-7305.1981.tb03389.x
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:923 / 928
页数:6
相关论文
共 5 条
[1]
NOISE BEHAVIOR OF SCHOTTKY BARRIER GATE FIELD-EFFECT TRANSISTORS AT MICROWAVE FREQUENCIES
BAECHTOLD, W
论文数:
0
引用数:
0
h-index:
0
BAECHTOLD, W
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1971,
ED18
(02)
: 97
-
+
[2]
NOISE BEHAVIOR OF GAAS FIELD-EFFECT TRANSISTORS WITH SHORT GATE LENGTHS
BAECHTOLD, W
论文数:
0
引用数:
0
h-index:
0
BAECHTOLD, W
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1972,
ED19
(05)
: 674
-
+
[3]
Van Der Ziel A., 1970, NOISE SOURCES CHARAC
[4]
GATE NOISE IN FIELD EFFECT TRANSISTORS AT MODERATELY HIGH FREQUENCIES
VANDERZIEL, A
论文数:
0
引用数:
0
h-index:
0
VANDERZIEL, A
[J].
PROCEEDINGS OF THE IEEE,
1963,
51
(03)
: 461
-
&
[5]
VANDERZIEL A, 1962, P IRE, V50, P1808
←
1
→
共 5 条
[1]
NOISE BEHAVIOR OF SCHOTTKY BARRIER GATE FIELD-EFFECT TRANSISTORS AT MICROWAVE FREQUENCIES
BAECHTOLD, W
论文数:
0
引用数:
0
h-index:
0
BAECHTOLD, W
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1971,
ED18
(02)
: 97
-
+
[2]
NOISE BEHAVIOR OF GAAS FIELD-EFFECT TRANSISTORS WITH SHORT GATE LENGTHS
BAECHTOLD, W
论文数:
0
引用数:
0
h-index:
0
BAECHTOLD, W
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1972,
ED19
(05)
: 674
-
+
[3]
Van Der Ziel A., 1970, NOISE SOURCES CHARAC
[4]
GATE NOISE IN FIELD EFFECT TRANSISTORS AT MODERATELY HIGH FREQUENCIES
VANDERZIEL, A
论文数:
0
引用数:
0
h-index:
0
VANDERZIEL, A
[J].
PROCEEDINGS OF THE IEEE,
1963,
51
(03)
: 461
-
&
[5]
VANDERZIEL A, 1962, P IRE, V50, P1808
←
1
→