BUILT-IN SELF-TESTING OF RANDOM-ACCESS MEMORIES

被引：19

作者：

FRANKLIN, M

SALUJA, KK

机构：

[1] Department of Electrical and Computer Engineering, University of Wisconsin, Madison, WI 53706

来源：

COMPUTER | 1990年 / 23卷 / 10期

关键词：

D O I：

10.1109/2.58236

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

[No abstract available]

引用

页码：45 / 56

页数：12

共 9 条

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IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1990, 25 (02) :514-524

[3]

KINOSHITA K, 1986, IEEE T COMPUT, V35, P862, DOI 10.1109/TC.1986.1676677

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[5] A MULTIBIT TEST TRIGGER-CIRCUIT FOR MEGABIT SRAMS [J].

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IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1990, 25 (01) :68-71

[6] A 60-NS 4-MBIT CMOS DRAM WITH BUILT-IN SELF-TEST FUNCTION [J].

OHSAWA, T ;

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NATORI, K .

IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1987, 22 (05) :663-668

[7]

SRIDHAR T, 1985, P INT TEST C, P462

[8]

VANDEGOOR AJ, 1990, ACM COMPUT SURV, V22, P5

[9]

VOSS PH, 1989, IEEE J SOLID STATE C, P874

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