BALLISTIC ELECTRON-EMISSION MICROSCOPY AND SPECTROSCOPY OF AU/GAAS INTERFACES

被引：35

作者：

KAISER, WJ

BELL, LD

HECHT, MH

GRUNTHANER, FJ

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1989年 / 7卷 / 04期

关键词：

D O I：

10.1116/1.584585

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

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页码：945 / 949

页数：5

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