LOW-TEMPERATURE MAGNETIC FORCE MICROSCOPY

被引：36

作者：

HUG, HJ

MOSER, A

JUNG, T

FRITZ, O

WADAS, A

PARASHIKOV, I

GUNTHERODT, HJ

机构：

[1] Institut für Physik, Universität Basel, CH-4056 Basel

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1993年 / 64卷 / 10期

关键词：

D O I：

10.1063/1.1144383

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We have built a low temperature scanning force microscope which is able to measure contact and noncontact forces using the dc modes of force microscopy. We demonstrate the capabilities of our instrument on a magneto-optical disk at room temperature and at 77 K. Using a ferromagnetic thin film tip, the topography and the micromagnetic stray field of the sample is measured using the dc modes of force microscopy. The topographic and magnetic data are precisely correlated. The circular bit structure and the natural domain structure between the homogeneously magnetized bits is clearly visible. A lateral resolution below 100 nm and a force resolution of 10(-12) N is reproducibly achieved.

引用

页码：2920 / 2925

页数：6

共 14 条

[1] LOW-TEMPERATURE FORCE MICROSCOPE WITH ALL-FIBER INTERFEROMETER
ALBRECHT, TR
GRUTTER, P
RUGAR, D
SMITH, DPE
[J]. ULTRAMICROSCOPY, 1992, 42 : 1638 - 1646
[2] FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY
ALBRECHT, TR
GRUTTER, P
HORNE, D
RUGAR, D
[J]. JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) : 668 - 673
[3] MAGNETIC FORCE MICROSCOPY AND SUPERCONDUCTORS
BRUDER, C
[J]. PHYSICA C, 1991, 185 : 1671 - 1672
[4] SCANNING HALL PROBE MICROSCOPY
CHANG, AM
HALLEN, HD
HARRIOTT, L
HESS, HF
KAO, HL
KWO, J
MILLER, RE
WOLFE, R
VANDERZIEL, J
CHANG, TY
[J]. APPLIED PHYSICS LETTERS, 1992, 61 (16) : 1974 - 1976
[5] SCANNING HALL-PROBE MICROSCOPY OF A VORTEX AND FIELD FLUCTUATIONS IN LA1.85SR0.15CUO4 FILMS
CHANG, AM
HALLEN, HD
HESS, HF
KAO, HL
KWO, J
SUDBO, A
CHANG, TY
[J]. EUROPHYSICS LETTERS, 1992, 20 (07): : 645 - 650
[6] MAGNETIC-FIELD AND ORDER PARAMETER OF AN ANISOTROPIC TYPE-II SUPERCONDUCTOR WITH AN ISOLATED FLUX LINE
FRITZ, O
WULFERT, M
HUG, HJ
THOMAS, H
GUNTHERODT, HJ
[J]. PHYSICAL REVIEW B, 1993, 47 (01): : 384 - 389
[7] A LOW-TEMPERATURE ATOMIC FORCE SCANNING TUNNELING MICROSCOPE FOR ULTRAHIGH-VACUUM
GIESSIBL, FJ
GERBER, C
BINNIG, G
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 984 - 988
[8] THEORETICAL ESTIMATES OF FORCES ACTING ON A MAGNETIC FORCE MICROSCOPE TIP OVER A HIGH-TEMPERATURE SUPERCONDUCTOR
HUG, HJ
JUNG, T
GUNTERODT, HJ
THOMAS, H
[J]. PHYSICA C, 1991, 175 (3-4): : 357 - 362
[9] A HIGH-STABILITY AND LOW DRIFT ATOMIC FORCE MICROSCOPE
HUG, HJ
JUNG, T
GUNTHERODT, HJ
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (08) : 3900 - 3904
[10] HUG HJ, UNPUB

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