HYDROGEN INTERACTIONS WITH SELF-INTERSTITIALS IN SILICON

被引:35
作者
VAN DE WALLE, CG
NEUGEBAUER, J
机构
[1] Xerox Palo Alto Research Center, Palo Alto, CA 94304
来源
PHYSICAL REVIEW B | 1995年 / 52卷 / 20期
关键词
D O I
10.1103/PhysRevB.52.R14320
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We present a first-principles investigation of complexes between one or two hydrogen atoms and a Si self-interstitial (Si-i). The atomic structure of these complexes is a distortion of the (110) split-interstitial configuration. The (H,Si-i) complex has donor and acceptor levels in the band gap, both about 0.4 eV above the valence band. The (2H,Si-i) complex is electrically inactive, with all Si atoms bonded to four neighbors. The binding energy of H to the self-interstitial is about 2.4 eV (referenced to free atomic H). Consequences of these results for observation of self-interstitials and for processes such as point-defect condensation and dislocation nucleation are discussed.
引用
收藏
页码:14320 / 14323
页数:4
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