PULSED ION-BEAM IRRADIATION OF SILICON

被引:16
作者
CHU, WK
MADER, SR
GOREY, EF
BAGLIN, JEE
HODGSON, RT
NERI, JM
HAMMER, DA
机构
[1] IBM CORP,DIV GEN TECHNOL,HOPEWELL JUNCTION,NY 12533
[2] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
[3] CORNELL UNIV,PLASMA STUDIES LAB,ITHACA,NY 14853
来源
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1982年 / 194卷 / 1-3期
关键词
D O I
10.1016/0029-554X(82)90561-4
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:443 / 447
页数:5
相关论文
共 14 条
[11]   REASONS TO BELIEVE PULSED LASER ANNEALING OF SI DOES NOT INVOLVE SIMPLE THERMAL MELTING [J].
VANVECHTEN, JA ;
TSU, R ;
SARIS, FW ;
HOONHOUT, D .
PHYSICS LETTERS A, 1979, 74 (06) :417-421
[12]   NONTHERMAL PULSED LASER ANNEALING OF SI - PLASMA ANNEALING [J].
VANVECHTEN, JA ;
TSU, R ;
SARIS, FW .
PHYSICS LETTERS A, 1979, 74 (06) :422-426
[13]  
WHITE CW, 1980, LASER ELECTRON BEAM
[14]  
Yamada M., 1980, Journal of the Physical Society of Japan, V49, P1299