NONTHERMAL PULSED LASER ANNEALING OF SI - PLASMA ANNEALING

被引:268
作者
VANVECHTEN, JA [1 ]
TSU, R [1 ]
SARIS, FW [1 ]
机构
[1] FOM,INST ATOOM & MOLECUULFYS,AMSTERDAM,NETHERLANDS
关键词
D O I
10.1016/0375-9601(79)90242-1
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
In the accompanying paper we have given evidence that pulsed laser annealing of Si does not involve normal thermal melting and recrystallization. Here we argue the importance of the electron-hole plasma produced by the laser to the annealing process. © 1979.
引用
收藏
页码:422 / 426
页数:5
相关论文
共 37 条
[1]   PICOSECOND ELLIPSOMETRY OF TRANSIENT ELECTRON-HOLE PLASMAS IN GERMANIUM [J].
AUSTON, DH ;
SHANK, CV .
PHYSICAL REVIEW LETTERS, 1974, 32 (20) :1120-1123
[2]   TIME-RESOLVED REFLECTIVITY OF ION-IMPLANTED SILICON DURING LASER ANNEALING [J].
AUSTON, DH ;
SURKO, CM ;
VENKATESAN, TNC ;
SLUSHER, RE ;
GOLOVCHENKO, JA .
APPLIED PHYSICS LETTERS, 1978, 33 (05) :437-440
[3]   MELTING MODEL FOR PULSING-LASER ANNEALING OF IMPLANTED SEMICONDUCTORS [J].
BAERI, P ;
CAMPISANO, SU ;
FOTI, G ;
RIMINI, E .
JOURNAL OF APPLIED PHYSICS, 1979, 50 (02) :788-797
[4]   REFLECTIVITY ENHANCEMENT OF SEMICONDUCTORS BY Q-SWITCHED RUBY LASERS [J].
BIRNBAUM, M ;
STOCKER, TL .
JOURNAL OF APPLIED PHYSICS, 1968, 39 (13) :6032-+
[5]   EPR OF A [001] SI INTERSTITIAL COMPLEX IN IRRADIATED SILICON [J].
BROWER, KL .
PHYSICAL REVIEW B, 1976, 14 (03) :872-883
[6]   SPECIFIC HEAT AND HEAT OF CRYSTALLIZATION OF AMORPHOUS GERMANIUM [J].
CHEN, HS ;
TURNBULL, D .
JOURNAL OF APPLIED PHYSICS, 1969, 40 (10) :4214-&
[7]   SHAPES OF 2-PHONON RECOMBINATION PEAKS IN SILICON [J].
FOLLAND, NO .
PHYSICAL REVIEW B, 1970, 1 (04) :1648-&
[8]   THERMAL CONDUCTIVITY OF SILICON + GERMANIUM FROM 3 DEGREES K TO MELTING POINT [J].
GLASSBRENNER, CJ ;
SLACK, GA .
PHYSICAL REVIEW, 1964, 134 (4A) :1058-+
[9]  
GLAZOV VM, 1969, LIQUID SEMICONDUCTOR, P67
[10]  
GOLDSTEIN M, 1973, PHASE TRANSITIONS 19, P263