ANNEALING OF METAL METALLOID MULTILAYERS STUDIED BY IN-SITU ELECTRON-MICROSCOPY

被引：6

作者：

SINCLAIR, R

KONNO, TJ

机构：

[1] Department of Materials Science and Engineering, Stanford University, Stanford

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1993年 / 126卷 / 1-3期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0304-8853(93)90557-I

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We have studied the changes in structure of metal-metalloid multilayers using in-situ high-resolution electron microscopy. For reactive systems, compound formation ultimately results, but this can be preceded by solid state amorphization. For nonreactive systems, crystallization of the metalloid completely disrupts the multilayer structure.

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页码：108 / 112

页数：5

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