DETERMINATION OF THE IMAGING CONDITIONS IN OFF-AXIS SIDE-BAND STEM HOLOGRAPHY

被引：2

作者：

GRIBELYUK, MA

COWLEY, JM

机构：

[1] Department of Physics, Arizona State University, Tempe

来源：

ULTRAMICROSCOPY | 1992年 / 45卷 / 01期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0304-3991(92)90043-J

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A new method for the local determination of the transfer function parameters and the beam separation is proposed for high-resolution STEM off-axis side-band holography. The effects of the finite spatial resolution, dynamical scattering and the interference of the conjugate images on the refinement accuracy are discussed on the basis of a computer analysis.

引用

页码：115 / 125

页数：11

共 13 条

[1] HIGH-RESOLUTION SIDE-BAND HOLOGRAPHY WITH A STEM INSTRUMENT [J].