SURFACE-STRUCTURE AND BONDING OF THE CLEAVAGE FACES OF TETRAHEDRALLY COORDINATED II-VI COMPOUNDS

被引：48

作者：

DUKE, CB ^{[1
]}

WANG, YR ^{[1
]}

机构：

[1] XEROX CORP, PALO ALTO RES CTR, PALO ALTO, CA 94304 USA

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1988年 / 6卷 / 04期

关键词：

D O I：

10.1116/1.584237

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1440 / 1443

页数：4

共 34 条

[1] IMPORTANCE OF RESONANCES IN SURFACE-ELECTRONIC-STATE SPECTROSCOPY - (110) SURFACES OF ZNSE AND ZNTE
BERES, RP
ALLEN, RE
DOW, JD
[J]. PHYSICAL REVIEW B, 1982, 26 (02): : 769 - 772
[2] (110) SURFACE ATOMIC STRUCTURES OF COVALENT AND IONIC SEMICONDUCTORS
CHADI, DJ
[J]. PHYSICAL REVIEW B, 1979, 19 (04): : 2074 - 2082
[3] THEORETICAL-STUDY OF THE ATOMIC-STRUCTURE OF SILICON (211), (311), AND (331) SURFACES
CHADI, DJ
[J]. PHYSICAL REVIEW B, 1984, 29 (02): : 785 - 792
[4] OSCILLATORY SURFACE RELAXATIONS IN NI, AL, AND THEIR ORDERED ALLOYS
CHEN, SP
VOTER, AF
SROLOVITZ, DJ
[J]. PHYSICAL REVIEW LETTERS, 1986, 57 (11) : 1308 - 1311
[5] DYNAMICAL ANALYSIS OF LOW-ENERGY ELECTRON-DIFFRACTION INTENSITIES FROM CDSE(1010)
DUKE, CB
PATON, A
WANG, YR
STILES, K
KAHN, A
[J]. SURFACE SCIENCE, 1988, 197 (1-2) : 11 - 23
[6] ATOMIC GEOMETRIES OF THE (110) SURFACES OF III-V-COMPOUND SEMICONDUCTORS - DETERMINATION BY TOTAL-ENERGY MINIMIZATION AND ELASTIC LOW-ENERGY ELECTRON-DIFFRACTION
DUKE, CB
MAILHIOT, C
PATON, A
CHADI, DJ
KAHN, A
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (04): : 1087 - 1088
[7] CALCULATION OF LOW-ENERGY-ELECTRON-DIFFRACTION INTENSITIES FROM ZNO (1010) .2. INFLUENCE OF CALCULATIONAL PROCEDURE, MODEL POTENTIAL, AND 2ND-LAYER STRUCTURAL DISTORTIONS
DUKE, CB
MEYER, RJ
PATON, A
MARK, P
[J]. PHYSICAL REVIEW B, 1978, 18 (08): : 4225 - 4240
[8] LOW-ENERGY-ELECTRON-DIFFRACTION ANALYSIS OF ATOMIC GEOMETRY OF ZNO(1010)
DUKE, CB
LUBINSKY, AR
CHANG, SC
LEE, BW
MARK, P
[J]. PHYSICAL REVIEW B, 1977, 15 (10): : 4865 - 4873
[9] MECHANISM AND CONSEQUENCES OF SURFACE RECONSTRUCTION ON THE CLEAVAGE FACES OF WURTZITE-STRUCTURE COMPOUND SEMICONDUCTORS
DUKE, CB
WANG, YR
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1988, 6 (03): : 692 - 695
[10] STRUCTURAL CHEMISTRY OF THE CLEAVAGE FACES OF COMPOUND SEMICONDUCTORS
DUKE, CB
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1983, 1 (03): : 732 - 735

← 1 2 3 4 →