STRUCTURAL-PROPERTIES OF CDMGTE/CDTE SUPERLATTICES

被引：4

作者：

GERTHSEN, D

MEERTENS, D

HEINKE, H

WAAG, A

LITZ, T

LANDWEHR, G

机构：

[1] FORSCHUNGSZENTRUM JULICH, INST FESTKORPERFORSCH, D-52425 JULICH, GERMANY

[2] UNIV WURZBURG, INST PHYS, D-97074 WURZBURG, GERMANY

来源：

JOURNAL OF APPLIED PHYSICS | 1994年 / 75卷 / 11期

关键词：

D O I：

10.1063/1.356643

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

CdMgTe/CdTe superlattices with a high degree of structural perfection were grown on CdTe and Cd0.975Zn0.025Te substrates by molecular-beam epitaxy. The structural properties of the superlattices, i.e., the morphology of the layers and the state of strain relaxation, were examined by transmission electron microscopy and x-ray diffractometry. High-resolution transmission electron microscopy (HRTEM) reveals the structural quality of the superlattices on an atomic scale. The width of the chemical transition between the CdTe and CdMgTe layers was determined by HRTEM using chemically sensitive imaging conditions. Two different mechanisms of misfit dislocation generation could be observed in situ in the electron microscope studying a cross-section specimen of a superlattice which was originally fully strained.

引用

页码：7323 / 7329

页数：7

共 26 条

[1] CHARACTERIZATION OF THIN-LAYERS ON PERFECT CRYSTALS WITH A MULTIPURPOSE HIGH-RESOLUTION X-RAY DIFFRACTOMETER [J].

BARTELS, WJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1983, 1 (02) :338-345

[2] X-RAY-DIFFRACTION OF MULTILAYERS AND SUPERLATTICES [J].

BARTELS, WJ ;

HORNSTRA, J ;

LOBEEK, DJW .

ACTA CRYSTALLOGRAPHICA SECTION A, 1986, 42 :539-545

[3] PRECISION LATTICE CONSTANT DETERMINATION [J].

BOND, WL .

ACTA CRYSTALLOGRAPHICA, 1960, 13 (10) :814-818

[4] THE PREPARATION OF CROSS-SECTION SPECIMENS FOR TRANSMISSION ELECTRON-MICROSCOPY [J].

BRAVMAN, JC ;

SINCLAIR, R .

JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1984, 1 (01) :53-61

[5] THE PREPARATION OF TRANSMISSION ELECTRON-MICROSCOPE SPECIMENS FROM COMPOUND SEMICONDUCTORS BY ION MILLING [J].

CHEW, NG ;

CULLIS, AG .

ULTRAMICROSCOPY, 1987, 23 (02) :175-198

[6] FORMATION AND ELIMINATION OF SURFACE ION MILLING DEFECTS IN CADMIUM TELLURIDE, ZINC-SULFIDE AND ZINC SELENIDE [J].

CULLIS, AG ;

CHEW, NG ;

HUTCHISON, JL .

ULTRAMICROSCOPY, 1985, 17 (03) :203-211

[7] DISLOCATION NUCLEATION NEAR THE CRITICAL THICKNESS IN GESI/SI STRAINED LAYERS [J].

EAGLESHAM, DJ ;

KVAM, EP ;

MAHER, DM ;

HUMPHREYS, CJ ;

BEAN, JC .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1989, 59 (05) :1059-1073

[8] THE SIMULATION AND INTERPRETATION OF DIFFRACTION PROFILES FROM PARTIALLY RELAXED LAYER STRUCTURES [J].

FEWSTER, PF .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1992, 25 (pt 6) :714-723

[9] MULTICRYSTAL X-RAY-DIFFRACTION OF HETEROEPITAXIAL STRUCTURES [J].

FEWSTER, PF .

APPLIED SURFACE SCIENCE, 1991, 50 (1-4) :9-18

[10] NEW TYPE OF SOURCE GENERATING MISFIT DISLOCATIONS [J].

HAGEN, W ;

STRUNK, H .

APPLIED PHYSICS, 1978, 17 (01) :85-87

← 1 2 3 →