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REDUCTION OF INTERFACE STATES AND FABRICATION OF P-CHANNEL INVERSION-TYPE INP-MISFET
被引:35
作者
:
OKAMURA, M
论文数:
0
引用数:
0
h-index:
0
OKAMURA, M
KOBAYASHI, T
论文数:
0
引用数:
0
h-index:
0
KOBAYASHI, T
机构
:
来源
:
JAPANESE JOURNAL OF APPLIED PHYSICS
|
1980年
/ 19卷
/ 10期
关键词
:
D O I
:
10.1143/JJAP.19.L599
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:L599 / L602
页数:4
相关论文
共 11 条
[1]
INP-SIO2 MIS STRUCTURE WITH REDUCED INTERFACE STATE DENSITY NEAR CONDUCTION-BAND
FRITZSCHE, D
论文数:
0
引用数:
0
h-index:
0
FRITZSCHE, D
[J].
ELECTRONICS LETTERS,
1978,
14
(03)
: 51
-
52
[2]
FRITZSCHE D, 1979, JUL C INS FILMS SEM
[3]
PHYSICAL LIMITATIONS ON FREQUENCY RESPONSE OF A SEMICONDUCTOR SURFACE INVERSION LAYER
HOFSTEIN, SR
论文数:
0
引用数:
0
h-index:
0
HOFSTEIN, SR
WARFIELD, G
论文数:
0
引用数:
0
h-index:
0
WARFIELD, G
[J].
SOLID-STATE ELECTRONICS,
1965,
8
(03)
: 321
-
+
[4]
PROPERTIES OF GAAS-AL2O3 AND INP-AL2O3 INTERFACES AND THE FABRICATION OF MIS FIELD-EFFECT TRANSISTORS
KAMIMURA, K
论文数:
0
引用数:
0
h-index:
0
机构:
Tokyo Institute of Technology, Meguro-ku, Tokyo
KAMIMURA, K
SAKAI, Y
论文数:
0
引用数:
0
h-index:
0
机构:
Tokyo Institute of Technology, Meguro-ku, Tokyo
SAKAI, Y
[J].
THIN SOLID FILMS,
1979,
56
(1-2)
: 215
-
223
[5]
INP-AL2O3 N-CHANNEL INVERSION-MODE MOSFETS USING SULFUR-DIFFUSED SOURCE AND DRAIN
KAWAKAMI, T
论文数:
0
引用数:
0
h-index:
0
机构:
Musashino Electrical Communication Laboratory, Nippon Telegraph & Telephone Public Corporation, Musashino-shi, Tokyo
KAWAKAMI, T
OKAMURA, M
论文数:
0
引用数:
0
h-index:
0
机构:
Musashino Electrical Communication Laboratory, Nippon Telegraph & Telephone Public Corporation, Musashino-shi, Tokyo
OKAMURA, M
[J].
ELECTRONICS LETTERS,
1979,
15
(16)
: 502
-
504
[6]
N-CHANNEL INVERSION-MODE INP MISFET
LILE, DL
论文数:
0
引用数:
0
h-index:
0
LILE, DL
COLLINS, DA
论文数:
0
引用数:
0
h-index:
0
COLLINS, DA
MEINERS, LG
论文数:
0
引用数:
0
h-index:
0
MEINERS, LG
MESSICK, L
论文数:
0
引用数:
0
h-index:
0
MESSICK, L
[J].
ELECTRONICS LETTERS,
1978,
14
(20)
: 657
-
659
[7]
CAPACITANCE-VOLTAGE AND SURFACE PHOTO-VOLTAGE MEASUREMENTS OF PYROLYTICALLY DEPOSITED SIO2 ON INP
MEINERS, LG
论文数:
0
引用数:
0
h-index:
0
机构:
Electronic Material Sciences Division, Naval Ocean Systems Center, San Diego
MEINERS, LG
[J].
THIN SOLID FILMS,
1979,
56
(1-2)
: 201
-
207
[8]
INP-SIO2 MIS STRUCTURE
MESSICK, L
论文数:
0
引用数:
0
h-index:
0
机构:
USN,CTR ELECTR LAB,SAN DIEGO,CA 92152
USN,CTR ELECTR LAB,SAN DIEGO,CA 92152
MESSICK, L
[J].
JOURNAL OF APPLIED PHYSICS,
1976,
47
(11)
: 4949
-
4951
[9]
OKAMURA M, UNPUBLISHED
[10]
FUNDAMENTAL-STUDIES OF III-V SURFACES AND THE (III-V)-OXIDE INTERFACE
SPICER, WE
论文数:
0
引用数:
0
h-index:
0
机构:
Stanford Electronics Laboratories, Stanford University, Stanford
SPICER, WE
LINDAU, I
论文数:
0
引用数:
0
h-index:
0
机构:
Stanford Electronics Laboratories, Stanford University, Stanford
LINDAU, I
PIANETTA, P
论文数:
0
引用数:
0
h-index:
0
机构:
Stanford Electronics Laboratories, Stanford University, Stanford
PIANETTA, P
CHYE, PW
论文数:
0
引用数:
0
h-index:
0
机构:
Stanford Electronics Laboratories, Stanford University, Stanford
CHYE, PW
GARNER, CM
论文数:
0
引用数:
0
h-index:
0
机构:
Stanford Electronics Laboratories, Stanford University, Stanford
GARNER, CM
[J].
THIN SOLID FILMS,
1979,
56
(1-2)
: 1
-
18
←
1
2
→
共 11 条
[1]
INP-SIO2 MIS STRUCTURE WITH REDUCED INTERFACE STATE DENSITY NEAR CONDUCTION-BAND
FRITZSCHE, D
论文数:
0
引用数:
0
h-index:
0
FRITZSCHE, D
[J].
ELECTRONICS LETTERS,
1978,
14
(03)
: 51
-
52
[2]
FRITZSCHE D, 1979, JUL C INS FILMS SEM
[3]
PHYSICAL LIMITATIONS ON FREQUENCY RESPONSE OF A SEMICONDUCTOR SURFACE INVERSION LAYER
HOFSTEIN, SR
论文数:
0
引用数:
0
h-index:
0
HOFSTEIN, SR
WARFIELD, G
论文数:
0
引用数:
0
h-index:
0
WARFIELD, G
[J].
SOLID-STATE ELECTRONICS,
1965,
8
(03)
: 321
-
+
[4]
PROPERTIES OF GAAS-AL2O3 AND INP-AL2O3 INTERFACES AND THE FABRICATION OF MIS FIELD-EFFECT TRANSISTORS
KAMIMURA, K
论文数:
0
引用数:
0
h-index:
0
机构:
Tokyo Institute of Technology, Meguro-ku, Tokyo
KAMIMURA, K
SAKAI, Y
论文数:
0
引用数:
0
h-index:
0
机构:
Tokyo Institute of Technology, Meguro-ku, Tokyo
SAKAI, Y
[J].
THIN SOLID FILMS,
1979,
56
(1-2)
: 215
-
223
[5]
INP-AL2O3 N-CHANNEL INVERSION-MODE MOSFETS USING SULFUR-DIFFUSED SOURCE AND DRAIN
KAWAKAMI, T
论文数:
0
引用数:
0
h-index:
0
机构:
Musashino Electrical Communication Laboratory, Nippon Telegraph & Telephone Public Corporation, Musashino-shi, Tokyo
KAWAKAMI, T
OKAMURA, M
论文数:
0
引用数:
0
h-index:
0
机构:
Musashino Electrical Communication Laboratory, Nippon Telegraph & Telephone Public Corporation, Musashino-shi, Tokyo
OKAMURA, M
[J].
ELECTRONICS LETTERS,
1979,
15
(16)
: 502
-
504
[6]
N-CHANNEL INVERSION-MODE INP MISFET
LILE, DL
论文数:
0
引用数:
0
h-index:
0
LILE, DL
COLLINS, DA
论文数:
0
引用数:
0
h-index:
0
COLLINS, DA
MEINERS, LG
论文数:
0
引用数:
0
h-index:
0
MEINERS, LG
MESSICK, L
论文数:
0
引用数:
0
h-index:
0
MESSICK, L
[J].
ELECTRONICS LETTERS,
1978,
14
(20)
: 657
-
659
[7]
CAPACITANCE-VOLTAGE AND SURFACE PHOTO-VOLTAGE MEASUREMENTS OF PYROLYTICALLY DEPOSITED SIO2 ON INP
MEINERS, LG
论文数:
0
引用数:
0
h-index:
0
机构:
Electronic Material Sciences Division, Naval Ocean Systems Center, San Diego
MEINERS, LG
[J].
THIN SOLID FILMS,
1979,
56
(1-2)
: 201
-
207
[8]
INP-SIO2 MIS STRUCTURE
MESSICK, L
论文数:
0
引用数:
0
h-index:
0
机构:
USN,CTR ELECTR LAB,SAN DIEGO,CA 92152
USN,CTR ELECTR LAB,SAN DIEGO,CA 92152
MESSICK, L
[J].
JOURNAL OF APPLIED PHYSICS,
1976,
47
(11)
: 4949
-
4951
[9]
OKAMURA M, UNPUBLISHED
[10]
FUNDAMENTAL-STUDIES OF III-V SURFACES AND THE (III-V)-OXIDE INTERFACE
SPICER, WE
论文数:
0
引用数:
0
h-index:
0
机构:
Stanford Electronics Laboratories, Stanford University, Stanford
SPICER, WE
LINDAU, I
论文数:
0
引用数:
0
h-index:
0
机构:
Stanford Electronics Laboratories, Stanford University, Stanford
LINDAU, I
PIANETTA, P
论文数:
0
引用数:
0
h-index:
0
机构:
Stanford Electronics Laboratories, Stanford University, Stanford
PIANETTA, P
CHYE, PW
论文数:
0
引用数:
0
h-index:
0
机构:
Stanford Electronics Laboratories, Stanford University, Stanford
CHYE, PW
GARNER, CM
论文数:
0
引用数:
0
h-index:
0
机构:
Stanford Electronics Laboratories, Stanford University, Stanford
GARNER, CM
[J].
THIN SOLID FILMS,
1979,
56
(1-2)
: 1
-
18
←
1
2
→